Fingerprint Dive into the research topics where BA14 Sensing and integration is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.

Silicon Chemical Compounds
silicon Physics & Astronomy
Printing Engineering & Materials Science
MEMS Engineering & Materials Science
Substrates Engineering & Materials Science
Sensors Engineering & Materials Science
microelectromechanical systems Physics & Astronomy
sensors Physics & Astronomy

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Profiles

No photo of Jouni Ahopelto

Jouni Ahopelto

Person: Research Professors, Senior Advisors

19842019
No photo of Mauri Aikio

Mauri Aikio

Person: Senior Principal Scientists, Principal Scientists

19902017
No photo of Sanna Aikio

Sanna Aikio

Person: Senior Scientists

20002019

Projects 2012 2021

Research Output 1982 2019

0.6V threshold voltage thin film transistors with solution processable indium oxide (In2O3) Channel and Anodized High-κ Al2O3 Dielectric

Bhalerao, S. R., Lupo, D., Zangiabadi, A., Kymissis, I., Leppaniemi, J., Alastalo, A. & Berger, P. R., 22 May 2019, In : IEEE Electron Device Letters. 40, 7, p. 1112-1115 4 p., 8720175.

Research output: Contribution to journalArticleScientificpeer-review

Thin film transistors
Threshold voltage
Indium
Oxides
Transistors

Active Hyperspectral Sensor Based on MEMS Fabry-Pérot Interferometer

Kääriäinen, T., Jaanson, P., Vaigu, A., Mannila, R. & Manninen, A., 2019, In : Sensors. 19, 9, 2192.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
Micro-Electrical-Mechanical Systems
Interferometers
microelectromechanical systems
MEMS
interferometers

Advanced Lateral High Aspect Ratio Test Structures for Conformality Characterization by Optical Microscopy

Ylivaara, O. M. E., Hyttinen, P., Arts, K., Gao, F., Erwin Kessels, W. M. M., Puurunen, R. L. & Utriainen, M., 22 Jul 2019, ALD 2019 Technical Program & Abstracts. American Vacuum Society AVS

Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsScientific

high aspect ratio
microscopy
image analysis
atomic layer epitaxy
metrology

Prizes

2017 EuMC Microwave Prize

Pekka Pursula (Recipient), Antti Lamminen (Recipient), Mikko Kantanen (Recipient), Jaakko Saarilahti (Recipient) & Vladimir Ermolov (Recipient), 12 Oct 2017

Prize

microwave

Activities 2014 2018

  • 2 Oral presentation
  • 1 Organising a conference, workshop, ...
  • 1 Publication Peer-review

Nanoscale and Microscale Heat Transfer VI, NMHT-VI

Alberto Ronzani (Participant)
2 Dec 20187 Dec 2018

Activity: Participating in or organising an event typesOrganising a conference, workshop, ...

Thin-Film Conformality Analysis, Reliability and Modeling using All-Silicon Lateral High Aspect Ratio Structures

Oili M.E. Ylivaara (Speaker), Virpi Korpelainen (Speaker), Markku Ylilammi (Speaker), Riikka L. Puurunen (Speaker)
31 Jul 2018

Activity: Talk or presentation typesOral presentation

Stresses in ALD films: Aiming for zero stress thin films

Riina Ritasalo (Speaker), Oili M.E. Ylivaara (Speaker), Tero Pilvi (Speaker), Tommi Suni (Speaker)
31 Jul 2018

Activity: Talk or presentation typesOral presentation