Research Output per year
Fingerprint Dive into the research topics where BA1702 Length metrology is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.
Calibration
Engineering & Materials Science
Interferometers
Engineering & Materials Science
interferometers
Physics & Astronomy
Lasers
Engineering & Materials Science
Gage blocks
Engineering & Materials Science
metrology
Physics & Astronomy
Microscopes
Engineering & Materials Science
Interferometer
Mathematics
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Profiles
Veli-Pekka Esala
- BA1702 Length metrology - Senior Specialist
Person: Senior Specialists, Specialists and Controllers
Research Output 1985 2019
1
Citation
(Scopus)
Device and method for measuring thickness variation of large roller element bearing rings
Viitala, R., Viitala, R., Gruber, G., Hemming, B., Widmaier, T., Tammi, K. & Kuosmanen, P., 1 Jan 2019, In : Precision Engineering. 55, p. 59-69 11 p.Research output: Contribution to journal › Article › Scientific › peer-review
Bearings (structural)
Rotors
Fast Fourier transforms
Linking the optical and the mechanical measurements of dimension by a Newton's rings method
Balling, P., Ramotowski, Z., Szumski, R., Lassila, A., Křen, P. & Mašika, P., 8 Mar 2019, In : Metrologia. 56, 2, 14 p., 025008.Research output: Contribution to journal › Article › Scientific › peer-review
Gage blocks
Gages
Interferometers
Steel
Surface roughness
Material standards design for minimum zone fitting of freeform optics
Arezki, Y., Lepretre, F., Psota, P., Su, R., Heikkinen, V., Zhang, X., Cai, N., Bitou, Y., Leach, R., Lédl, V., Anwer, N., Mehdi-Souzani, C. & Nouira, H., Jun 2019, 19th International Conference of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2019. Euspen, p. 264-267Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
Optics
optics
valleys
Coordinate measuring machines
artifacts
Activities 2018 2018
- 1 Oral presentation
Thin-Film Conformality Analysis, Reliability and Modeling using All-Silicon Lateral High Aspect Ratio Structures
Oili M.E. Ylivaara (Speaker), Virpi Korpelainen (Speaker), Markku Ylilammi (Speaker), Riikka L. Puurunen (Speaker)31 Jul 2018
Activity: Talk or presentation types › Oral presentation