Research output per year
Research output per year
Fingerprint
Dive into the research topics where BA1702 Length metrology is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.
Network
Recent external collaboration on country level. Dive into details by clicking on the dots or
Profiles
Research output
-
Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
Arezki, Y., Su, R., Heikkinen, V., Leprete, F., Posta, P., Bitou, Y., Schober, C., Mehdi-Souzani, C., Alzahrani, B. A. M., Zhang, X., Kondo, Y., Pruss, C., Ledl, V., Anwer, N., Bouazizi, M. L., Leach, R. & Nouira, H., Feb 2021, In: Sensors (Switzerland). 21, 4, p. 1-19 19 p., 1103.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile -
Conformality in Aluminum Oxide ALD Process Analyzed using 3rd Generation Silicon Based Lateral High Aspect Ratio Test Structures
Yim, J., Ylivaara, O. M. E., Ylilammi, M., Korpelainen, V., Haimi, E., Verkama, E., Utriainen, M. & Puurunen, R. L., Jun 2020.Research output: Contribution to conference › Conference Poster › Scientific › peer-review
-
Cumulative inaccuracies in implementation of additive manufacturing through medical imaging, 3D thresholding, and 3D modeling: A case study for an end-use implant
Akmal, J. S., Salmi, M., Hemming, B., Teir, L., Suomalainen, A., Kortesniemi, M., Partanen, J. & Lassila, A., 1 Apr 2020, In: Applied Sciences (Switzerland). 10, 8, 2968.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access3 Citations (Scopus)
Datasets
-
Cumulative inaccuracies in implementation of additive manufacturing through medical imaging, 3D thresholding, and 3D modeling: A case study for an end-use implant
Akmal, J. (Contributor), Salmi, M. (Contributor), Hemming, B. (Contributor), Teir, L. (Contributor), Suomalainen, A. (Contributor), Kortesniemi, M. (Contributor), Partanen, J. (Contributor) & Lassila, A. (Contributor), 25 Apr 2020
Dataset
Activities
- 1 Conference presentation
-
Thin-Film Conformality Analysis, Reliability and Modeling using All-Silicon Lateral High Aspect Ratio Structures
Oili M.E. Ylivaara (Speaker), Virpi Korpelainen (Speaker), Markku Ylilammi (Speaker) & Riikka L. Puurunen (Speaker)
31 Jul 2018Activity: Talk or presentation types › Conference presentation