Fingerprint Dive into the research topics where BA1702 Length metrology is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.

Calibration Engineering & Materials Science
Interferometers Engineering & Materials Science
interferometers Physics & Astronomy
Lasers Engineering & Materials Science
Gage blocks Engineering & Materials Science
metrology Physics & Astronomy
Microscopes Engineering & Materials Science
Interferometer Mathematics

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Profiles

No photo of Ville Byman

Ville Byman

Person: Research Scientists

20152018
No photo of Veli-Pekka Esala

Veli-Pekka Esala

Person: Senior Specialists, Specialists and Controllers

19852018
No photo of Ville Heikkinen

Ville Heikkinen

Person: Research Scientists

20132019

Research Output 1985 2019

1 Citation (Scopus)

Device and method for measuring thickness variation of large roller element bearing rings

Viitala, R., Viitala, R., Gruber, G., Hemming, B., Widmaier, T., Tammi, K. & Kuosmanen, P., 1 Jan 2019, In : Precision Engineering. 55, p. 59-69 11 p.

Research output: Contribution to journalArticleScientificpeer-review

Bearings (structural)
Rotors
Fast Fourier transforms

Linking the optical and the mechanical measurements of dimension by a Newton's rings method

Balling, P., Ramotowski, Z., Szumski, R., Lassila, A., Křen, P. & Mašika, P., 8 Mar 2019, In : Metrologia. 56, 2, 14 p., 025008.

Research output: Contribution to journalArticleScientificpeer-review

Gage blocks
Gages
Interferometers
Steel
Surface roughness

Material standards design for minimum zone fitting of freeform optics

Arezki, Y., Lepretre, F., Psota, P., Su, R., Heikkinen, V., Zhang, X., Cai, N., Bitou, Y., Leach, R., Lédl, V., Anwer, N., Mehdi-Souzani, C. & Nouira, H., Jun 2019, 19th International Conference of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2019. Euspen, p. 264-267

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Optics
optics
valleys
Coordinate measuring machines
artifacts

Activities 2018 2018

  • 1 Oral presentation

Thin-Film Conformality Analysis, Reliability and Modeling using All-Silicon Lateral High Aspect Ratio Structures

Oili M.E. Ylivaara (Speaker), Virpi Korpelainen (Speaker), Markku Ylilammi (Speaker), Riikka L. Puurunen (Speaker)
31 Jul 2018

Activity: Talk or presentation typesOral presentation