Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Dive into the research topics where Antti Lassila is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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ViDiT: Trustworthy virtual experiments and digital twins
Lassila, A. (Owner), Hemming, B. (Manager), Teir, L. (Participant) & Nyholm, K. (Participant)
EURAMET e.V. - European Partnership on Metrology
1/05/23 → 30/04/26
Project: EU project
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MetExSPM: Traceability of localised functional properties of nanostructures with high-speed scanning probe microscopy
Korpelainen, V. (Manager), Lassila, A. (Owner), Sauvet, B. (Participant), Nysten, J. (Participant), Byman, V. (Participant) & Nyholm, K. (Participant)
1/09/21 → 31/08/24
Project: EU project
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ATMOC: Traceable metrology of soft-X-ray to IR optical constants and nanofilms for advanced manufacturing
Lassila, A. (Manager), Korpelainen, V. (Participant) & Nysten, J. (Participant)
1/07/21 → 30/06/24
Project: EU project
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AdvanCT: Advanced computed tomography for dimensional and surface measurements in industry
Lassila, A. (Manager)
1/06/18 → 30/11/21
Project: EU project
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MetAMMI: Metrology for additively manufactured medical implants
Lassila, A. (Manager)
1/06/16 → 31/05/19
Project: EU project
Research output
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Editorial for the MST Special Issue NanoScale 2023
Korpelainen, V., Lassila, A., Brand, U. & Dziomba, T., 30 Apr 2025, In: Measurement Science and Technology. 36, 4, 040201.Research output: Contribution to journal › Other journal contribution › Scientific
Open Access -
Instrumentation and uncertainty evaluation for absolute characterization of thin films and nanostructured surfaces in advanced optical metrology
Hansen, P. E., Siaudinyte, L., Heidenreich, S., Soltwisch, V., Lokhorst, H. W., Tiwari, A., Makhotkin, I., Mattila, A., Lassila, A., Glabisch, S., Schröder, S., Brose, S., Nolot, E., Siefke, T., Asar, M., Memis, S., Yíldíz, F., Schiek, M. & Rømer, A. T., 14 Mar 2025, In: Metrologia. 62, 2, 025010.Research output: Contribution to journal › Article › Scientific › peer-review
1 Citation (Scopus) -
Reflectometry technique for study of complex multilayer micro- and nanostructures with lateral periodicity
Danilenko, A., Rastgou, M., Manoocheri, F., Kinnunen, J., Korpelainen, V., Lassila, A. & Ikonen, E., 7 Mar 2025, In: Journal of Applied Physics. 137, 9, 095302.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access -
Artificial neural network assisted spectral scatterometry for grating quality control
Mattila, A., Nysten, J., Heikkinen, V., Kilpi, J., Korpelainen, V., Hansen, P.-E., Karvinen, P., Kuittinen, M. & Lassila, A., 31 May 2024, In: Measurement Science and Technology. 35, 8, 085025.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile1 Citation (Scopus)37 Downloads (Pure) -
Characterization of PillarHall test chip structures using a reflectometry technique
Danilenko, A., Rastgou, M., Manoocheri, F., Kinnunen, J., Korpelainen, V., Lassila, A. & Ikonen, E., Sept 2023, In: Measurement Science and Technology. 34, 9, 094006.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access2 Citations (Scopus)
Datasets
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Cumulative inaccuracies in implementation of additive manufacturing through medical imaging, 3D thresholding, and 3D modeling: A case study for an end-use implant
Akmal, J. (Contributor), Salmi, M. (Contributor), Hemming, B. (Contributor), Teir, L. (Contributor), Suomalainen, A. (Contributor), Kortesniemi, M. (Contributor), Partanen, J. (Contributor) & Lassila, A. (Contributor), 25 Apr 2020
Dataset