Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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SDG 7 Affordable and Clean Energy -
SDG 9 Industry, Innovation, and Infrastructure -
SDG 12 Responsible Consumption and Production
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Collaborations and top research areas from the last five years
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A3SmartML: Automated, adaptive and uncertainty-aware smart measurements using machine learning
Lassila, A. (Manager)
1/05/25 → 30/04/28
Project: EU project
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ViDiT: Trustworthy virtual experiments and digital twins
Lassila, A. (Owner), Hemming, B. (Manager), Martin-Teir, L. (Participant) & Nyholm, K. (Participant)
EURAMET e.V. - European Partnership on Metrology
1/05/23 → 30/04/26
Project: EU project
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MetExSPM: Traceability of localised functional properties of nanostructures with high-speed scanning probe microscopy
Korpelainen, V. (Manager), Lassila, A. (Owner), Sauvet, B. (Participant), Nysten, J. (Participant), Byman, V. (Participant) & Nyholm, K. (Participant)
1/09/21 → 31/08/24
Project: EU project
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ATMOC: Traceable metrology of soft-X-ray to IR optical constants and nanofilms for advanced manufacturing
Lassila, A. (Manager), Korpelainen, V. (Participant) & Nysten, J. (Participant)
1/07/21 → 30/06/24
Project: EU project
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AdvanCT: Advanced computed tomography for dimensional and surface measurements in industry
Lassila, A. (Manager)
1/06/18 → 30/11/21
Project: EU project
Research output
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Editorial for the MST Special Issue NanoScale 2023
Korpelainen, V., Lassila, A., Brand, U. & Dziomba, T., 30 Apr 2025, In: Measurement Science and Technology. 36, 4, 040201.Research output: Contribution to journal › Other journal contribution › Scientific
Open Access -
Instrumentation and uncertainty evaluation for absolute characterization of thin films and nanostructured surfaces in advanced optical metrology
Hansen, P. E., Siaudinyte, L., Heidenreich, S., Soltwisch, V., Lokhorst, H. W., Tiwari, A., Makhotkin, I., Mattila, A., Lassila, A., Glabisch, S., Schröder, S., Brose, S., Nolot, E., Siefke, T., Asar, M., Memis, S., Yíldíz, F., Schiek, M. & Rømer, A. T., 14 Mar 2025, In: Metrologia. 62, 2, 025010.Research output: Contribution to journal › Article › Scientific › peer-review
2 Link opens in a new tab Citations (Scopus) -
Reflectometry technique for study of complex multilayer micro- and nanostructures with lateral periodicity
Danilenko, A., Rastgou, M., Manoocheri, F., Kinnunen, J., Korpelainen, V., Lassila, A. & Ikonen, E., 7 Mar 2025, In: Journal of Applied Physics. 137, 9, 095302.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access1 Link opens in a new tab Citation (Scopus) -
Artificial neural network assisted spectral scatterometry for grating quality control
Mattila, A., Nysten, J., Heikkinen, V., Kilpi, J., Korpelainen, V., Hansen, P.-E., Karvinen, P., Kuittinen, M. & Lassila, A., 31 May 2024, In: Measurement Science and Technology. 35, 8, 085025.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile6 Link opens in a new tab Citations (Scopus)106 Downloads (Pure) -
Characterization of PillarHall test chip structures using a reflectometry technique
Danilenko, A., Rastgou, M., Manoocheri, F., Kinnunen, J., Korpelainen, V., Lassila, A. & Ikonen, E., Sept 2023, In: Measurement Science and Technology. 34, 9, 094006.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access3 Link opens in a new tab Citations (Scopus)
Datasets
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Cumulative inaccuracies in implementation of additive manufacturing through medical imaging, 3D thresholding, and 3D modeling: A case study for an end-use implant
Akmal, J. (Contributor), Salmi, M. (Contributor), Hemming, B. (Contributor), Teir, L. (Contributor), Suomalainen, A. (Contributor), Kortesniemi, M. (Contributor), Partanen, J. (Contributor) & Lassila, A. (Contributor), 25 Apr 2020
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