Projects per year
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Finished
MetExSPM: Traceability of localised functional properties of nanostructures with high-speed scanning probe microscopy
Korpelainen, V. (Manager), Lassila, A. (Owner), Sauvet, B. (Participant), Nysten, J. (Participant), Byman, V. (Participant) & Nyholm, K. (Participant)
1/09/21 → 31/08/24
Project: EU project
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ATMOC: Traceable metrology of soft-X-ray to IR optical constants and nanofilms for advanced manufacturing
Lassila, A. (Manager), Korpelainen, V. (Participant) & Nysten, J. (Participant)
1/07/21 → 30/06/24
Project: EU project
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AdvanCT: Advanced computed tomography for dimensional and surface measurements in industry
Lassila, A. (Manager)
1/06/18 → 30/11/21
Project: EU project
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MetAMMI: Metrology for additively manufactured medical implants
Lassila, A. (Manager)
1/06/16 → 31/05/19
Project: EU project
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PhotInd: Metrology for the photonics industry – optical fibres, waveguides and applications
Lassila, A. (Manager) & Nyholm, K. (Participant)
1/08/15 → 31/07/18
Project: EU project
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MetHPM: Metrology for highly-parallel manufacturing
Lassila, A. (Manager)
1/05/15 → 30/04/18
Project: EU project