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Hannu Salmela

  • Phone+358407600090
20032020

Research output per year

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Research Output

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Article in a proceedings journal
2008

Peak current failure levels in ESD sensitive semiconductor devices and their application in evaluation of materials used in ESD protection: Part 1. Theoretical analysis

Smallwood, J., Salmela, H. & Paasi, J., 2008, In : Journal of Physics: Conference Series. 142, 1, 4 p., 012056.

Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

1 Citation (Scopus)

Peak current failure levels in ESD sensitive semiconductor devices and their application in evaluation of materials used in ESD protection: Part 2. Experimental verification

Paasi, J., Salmela, H. & Smallwood, J., 2008, In : Journal of Physics: Conference Series. 142, 1, 6 p., 012006.

Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review