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20082018

Research output per year

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Research Output

  • 17 Article
  • 7 Conference article in proceedings
  • 1 Report
  • 1 Dissertation
2018

Metrological characterization methods for confocal chromatic line sensors and optical topography sensors

Seppä, J., Niemelä, K. & Lassila, A., 9 Apr 2018, In : Measurement Science and Technology. 29, 5, 054008.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
4 Citations (Scopus)
2017

Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

Seppä, J., Reischl, B., Sairanen, H., Korpelainen, V., Husu, H., Heinonen, M., Raiteri, P., Rohl, A. L., Nordlund, K. & Lassila, A., 2017, In : Measurement Science and Technology. 28, 3, 10 p., 034004.

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

DNA origami structures as calibration standards for nanometrology

Korpelainen, V., Linko, V., Seppä, J., Lassila, A. & Kostiainen, M. A., 2017, In : Measurement Science and Technology. 28, 3, 6 p., 034001.

Research output: Contribution to journalArticleScientificpeer-review

Open Access
4 Citations (Scopus)
2016

The CCL-K11 ongoing key comparison. Final report for the year 2015

Seppä, J., Matus, M., Robertsson, L., van den Berg, S. & Czulek, D., 2016, In : Metrologia. 53, Technical supplement, p. 1-9 9 p.

Research output: Contribution to journalArticleScientificpeer-review

2015

Interference cancellation for hollow-core fiber reference cells

Seppä, J., Merimaa, M., Manninen, A., Triches, M., Hald, J. & Lassila, A., 2015, In : IEEE Transactions on Instrumentation and Measurement. 64, 6, p. 1595-1599

Research output: Contribution to journalArticleScientificpeer-review

Interference Cancellation for Hollow-Core Fiber Reference Cells

Seppä, J., Merimaa, M., Manninen, A., Triches, M., Hald, J. & Lassila, A., 1 Jun 2015, In : IEEE Transactions on Instrumentation and Measurement. 64, 6, p. 1595-1599 5 p., 7060653.

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Traceable methods for vertical scale characterization of dynamic stroboscopic scanning white-light interferometer measurements

Heikkinen, V., Kassamakov, I., Seppä, J., Paulin, T., Nolvi, A., Lassila, A. & Hæggström, E., 2015, In : Applied Optics. 54, 35, p. 10397-10403

Research output: Contribution to journalArticleScientificpeer-review

2014

Intercomparison of lateral scales of scanning electron microscopes and atomic force microscopes in research institutes in Northern Europe

Seppä, J., Korpelainen, V., Bergstrand, S., Karlsson, H., Lillepea, L. & Lassila, A., 1 Jan 2014, In : Measurement Science and Technology. 25, 4, 044013.

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)

Interference cancellation for hollow-core fiber reference cells

Seppä, J., Merimaa, M., Manninen, A. & Lassila, A., 1 Jan 2014, Digest. IEEE Institute of Electrical and Electronic Engineers, p. 672-673 2 p. 6898564

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Linear and traceable scales for nanometrology: Dissertation

Seppä, J., 2014, Espoo: Aalto University. 146 p.

Research output: ThesisDissertation

Sub-kHz traceable characterization of stroboscopic scanning white light interferometer

Heikkinen, V., Kassamakov, I., Paulin, T., Nolvi, A., Seppä, J., Lassila, A. & Hæggström, E., 2014, Optical Micro- and Nanometrology V. International Society for Optics and Photonics SPIE, 913218. (Proceedings of SPIE, Vol. 9132).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Traceable quasi-dynamic stroboscopic scanning white light interferometry

Heikkinen, V. V., Nolvi, A., Paulin, T., Seppä, J., Kassamakov, I., Lassila, A. & Hæggström, E., 1 Jan 2014, Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology. Springer, p. 491-496 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2013

Quasidynamic calibration of stroboscopic scanning white light interferometer with a transfer standard

Seppä, J., Kassamakov, I., Heikkinen, V., Nolvi, A., Paulin, T., Lassila, A. & Hæggström, E., 1 Dec 2013, In : Optical Engineering. 52, 12, 124104.

Research output: Contribution to journalArticleScientificpeer-review

7 Citations (Scopus)

Static and (quasi)dynamic calibration of stroboscopic scanning white light interferometer

Seppä, J., Kassamakov, I., Nolvi, A., Heikkinen, V., Paulin, T., Lassila, A., Hao, L. & Hæggsröm, E., 1 Aug 2013, Optical Measurement Systems for Industrial Inspection VIII. International Society for Optics and Photonics SPIE, 87883J. (Proceedings of SPIE, Vol. 8788).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)
2012

Comparison of the performance of the next generation of optical interferometers

Pisani, M., Yacoot, A., Balling, P., Bancone, N., Birlikseven, C., Celik, M., Flügge, J., Hamid, R., Köchert, P., Kren, P., Kuetgens, U., Lassila, A., Picotto, G. B., Sahin, E., Seppä, J., Tedaldi, M. & Weichert, C., 2012, In : Metrologia. 49, 4, p. 455-467 12 p.

Research output: Contribution to journalArticleScientificpeer-review

63 Citations (Scopus)

Intercomparison of lateral scales of SEM and AFM microscopes in research institutes in Northern Europe

Seppä, S. J., Korpelainen, V., Bergstrand, S., Karlsson, H., Lillepea, L. & Lassila, A., 2012, Espoo: Centre of Metrology and Accreditation. (MIKES Publication; No. J1/2012).

Research output: Book/ReportReport

Open Access
2011

A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor

Seppä, J., Korpelainen, V., Merimaa, M., Picotto, G. B. & Lassila, A., 2011, In : Measurement Science and Technology. 22, 9, 7 p., 094027.

Research output: Contribution to journalArticleScientificpeer-review

15 Citations (Scopus)

High-precision diode-laser-based temperature measurement for air refractive index compensation

Hieta, T., Merimaa, M., Vainio, M., Seppä, J. & Lassila, A., 2011, In : Applied Optics. 50, 31, p. 5990 - 5998

Research output: Contribution to journalArticleScientificpeer-review

15 Citations (Scopus)

Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFM

Korpelainen, V., Seppä, J. & Lassila, A., 2011, Proceedings of SPIE, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. International Society for Optics and Photonics SPIE, 80360Q. (Proceedings of SPIE, Vol. 8036).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)
2010

Design and characterization of MIKES metrological atomic force microscope

Korpelainen, V., Seppä, J. & Lassila, A., 2010, In : Precision Engineering. 34, 4, p. 735-744 10 p.

Research output: Contribution to journalArticleScientificpeer-review

60 Citations (Scopus)

Traceable characterization of a bending millimetre scale cantilever for nanoforce sensing

Stenlund, L., Riski, K., Seppä, J., Pudas, M., Vähäsöyrinki, M., Tuhkanen, V. & Röning, J., 2010, In : Measurement Science and Technology. 21, 7, 9 p.

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
2009

Design and characterization of the MIKES metrology atomic force microscope

Korpelainen, V., Seppä, J. & Lassila, A., 1 Jan 2009, Proceedings of the 9th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2009. Van Brussel, H., Burke, T., Spaan, H., Brinksmeier, E., Burke, T. & Burke, T. (eds.). Euspen, Vol. 2. p. 239-242 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

High accuracy laser diffractometer: Angle-scale traceability by the error separation method with a grating

Korpelainen, V., Iho, A., Seppä, J. & Lassila, A., 2009, In : Measurement Science and Technology. 20, 8, 8 p.

Research output: Contribution to journalArticleScientificpeer-review

16 Citations (Scopus)

Traceability for surface roughness measurements by metrology AFM

Hemming, B., Korpelainen, V., Seppä, J. & Lassila, A., 1 Jan 2009, Proceedings of the 9th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2009. Van Brussel, H., Burke, T., Spaan, H., Brinksmeier, E., Burke, T. & Burke, T. (eds.). Euspen, Vol. 2. p. 243-246 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)
2008

Agglomerative independent variable group analysis

Honkela, A., Seppä, J. & Alhoniemi, E., 1 Mar 2008, In : Neurocomputing. 71, 7-9, p. 1311-1320 10 p.

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)