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20082018

Research output per year

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Research Output

  • 17 Article
  • 7 Conference article in proceedings
  • 1 Report
  • 1 Dissertation
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Conference article in proceedings
2014

Interference cancellation for hollow-core fiber reference cells

Seppä, J., Merimaa, M., Manninen, A. & Lassila, A., 1 Jan 2014, Digest. IEEE Institute of Electrical and Electronic Engineers, p. 672-673 2 p. 6898564

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Sub-kHz traceable characterization of stroboscopic scanning white light interferometer

Heikkinen, V., Kassamakov, I., Paulin, T., Nolvi, A., Seppä, J., Lassila, A. & Hæggström, E., 2014, Optical Micro- and Nanometrology V. International Society for Optics and Photonics SPIE, 913218. (Proceedings of SPIE, Vol. 9132).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Traceable quasi-dynamic stroboscopic scanning white light interferometry

Heikkinen, V. V., Nolvi, A., Paulin, T., Seppä, J., Kassamakov, I., Lassila, A. & Hæggström, E., 1 Jan 2014, Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology. Springer, p. 491-496 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2013

Static and (quasi)dynamic calibration of stroboscopic scanning white light interferometer

Seppä, J., Kassamakov, I., Nolvi, A., Heikkinen, V., Paulin, T., Lassila, A., Hao, L. & Hæggsröm, E., 1 Aug 2013, Optical Measurement Systems for Industrial Inspection VIII. International Society for Optics and Photonics SPIE, 87883J. (Proceedings of SPIE, Vol. 8788).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)
2011

Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFM

Korpelainen, V., Seppä, J. & Lassila, A., 2011, Proceedings of SPIE, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences. International Society for Optics and Photonics SPIE, 80360Q. (Proceedings of SPIE, Vol. 8036).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)
2009

Design and characterization of the MIKES metrology atomic force microscope

Korpelainen, V., Seppä, J. & Lassila, A., 1 Jan 2009, Proceedings of the 9th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2009. Van Brussel, H., Burke, T., Spaan, H., Brinksmeier, E., Burke, T. & Burke, T. (eds.). Euspen, Vol. 2. p. 239-242 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Traceability for surface roughness measurements by metrology AFM

Hemming, B., Korpelainen, V., Seppä, J. & Lassila, A., 1 Jan 2009, Proceedings of the 9th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2009. Van Brussel, H., Burke, T., Spaan, H., Brinksmeier, E., Burke, T. & Burke, T. (eds.). Euspen, Vol. 2. p. 243-246 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)