Jussi Tenhunen

  • Phone+358405964623
1990 …2024

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  • 2017

    Method and apparatus for measuring inelastic scattering

    Tenhunen, J. (Inventor), Kostamovaara, J. (Inventor), Kurki, L. (Inventor), Nissinen, I. (Inventor), Nissinen, J. (Inventor) & Aikio, R. (Inventor), 17 Aug 2017, IPC No. G01N 21/ 65 A I, Patent No. US2017234797, Priority date 21 Jan 2016, Priority No. FI20160005037

    Research output: PatentPatent

  • 2016

    Device and method for optical measurement of a target

    Antila, J. (Inventor) & Tenhunen, J. (Inventor), 1 Sept 2016, IPC No. G01J 3/ 26 A I, Patent No. US2016252394, Priority date 21 Oct 2014, Priority No. WO2014FI50791

    Research output: PatentPatent

  • 2015

    Measurement of raman radiation

    Kostamovaara, J. (Inventor) & Tenhunen, J. (Inventor), 23 Dec 2015, IPC No. G01N 21/ 64 A I, Patent No. EP2956748, Priority date 13 Feb 2014, Priority No. WO2014FI50111

    Research output: PatentPatent

  • 2012

    Measurement of raman radiation

    Tenhunen, J. (Inventor) & Kostamovaara, J. (Inventor), 22 Aug 2012, IPC No. G01N 21/ 65 A I, Patent No. EP2488842, Priority date 8 Oct 2010, Priority No. WO2010FI50782

    Research output: PatentPatent