Projects per year
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Dive into the research topics where Ville Heikkinen is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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ADAM: Application of digital-metrological twins for emerging measurement technology in advanced manufacturing
Hemming, B. (Manager), Heikkinen, V. (Participant) & Teir, L. (Participant)
1/09/24 → 31/08/27
Project: EU project
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TracOptic: Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors
Heikkinen, V. (Manager)
1/06/21 → 31/05/24
Project: EU project
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NanoXSpot: Measurement of the focal spot size on X-ray tubes with spot sizes down to 100 nm
Korpelainen, V. (Manager) & Heikkinen, V. (Participant)
1/07/19 → 30/06/22
Project: EU project
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FreeFORM: Reference algorithms and metrology on aspherical and freeform lenses
Heikkinen, V. (Manager)
1/06/16 → 31/05/19
Project: EU project
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Artificial neural network assisted spectral scatterometry for grating quality control
Mattila, A., Nysten, J., Heikkinen, V., Kilpi, J., Korpelainen, V., Hansen, P.-E., Karvinen, P., Kuittinen, M. & Lassila, A., 31 May 2024, In: Measurement Science and Technology. 35, 8, 085025.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile1 Citation (Scopus)33 Downloads (Pure) -
A comparison of traceable spatial angle autocollimator calibrations performed by PTB and VTT MIKES
Geckeler, R. D., Schumann, M., Just, A., Krause, M., Lassila, A. & Heikkinen, V., Apr 2022, In: Metrologia. 59, 2, 024002.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access7 Citations (Scopus) -
Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
Arezki, Y., Su, R., Heikkinen, V., Leprete, F., Posta, P., Bitou, Y., Schober, C., Mehdi-Souzani, C., Alzahrani, B. A. M., Zhang, X., Kondo, Y., Pruss, C., Ledl, V., Anwer, N., Bouazizi, M. L., Leach, R. & Nouira, H., 5 Feb 2021, In: Sensors. 21, 4, p. 1-19 19 p., 1103.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile3 Citations (Scopus)173 Downloads (Pure) -
Multi-sensor optical profilometer for measurement of large freeforms at nm-level uncertainty
Heikkinen, V., Nysten, J., Byman, V., Hemming, B. & Lassila, A., 21 Dec 2020, In: Surface Topography: Metrology and Properties. 8, 4, 12 p., 045030.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile4 Citations (Scopus)73 Downloads (Pure) -
Step height standards based on self-assembly for 3D metrology of biological samples
Heikkinen, V., Kassamakov, I., Viitala, T., Järvinen, M., Vainikka, T., Nolvi, A., Bermúdez, C., Artigas, R., Martinez, P., Korpelainen, V., Lassila, A. & Hæggström, E., Sept 2020, In: Measurement Science and Technology. 31, 9, 094008.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access4 Citations (Scopus)