Projects per year
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Dive into the research topics where Ville Heikkinen is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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TracOptic: Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors
1/06/21 → 31/05/24
Project: EU project
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NanoXSpot: Measurement of the focal spot size on X-ray tubes with spot sizes down to 100 nm
Korpelainen, V. & Heikkinen, V.
1/07/19 → 30/06/22
Project: EU project
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FreeFORM: Reference algorithms and metrology on aspherical and freeform lenses
1/06/16 → 31/05/19
Project: EU project
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Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
Arezki, Y., Su, R., Heikkinen, V., Leprete, F., Posta, P., Bitou, Y., Schober, C., Mehdi-Souzani, C., Alzahrani, B. A. M., Zhang, X., Kondo, Y., Pruss, C., Ledl, V., Anwer, N., Bouazizi, M. L., Leach, R. & Nouira, H., 5 Feb 2021, In: Sensors (Switzerland). 21, 4, p. 1-19 19 p., 1103.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile54 Downloads (Pure) -
Multi-sensor optical profilometer for measurement of large freeforms at nm-level uncertainty
Heikkinen, V., Nysten, J., Byman, V., Hemming, B. & Lassila, A., 21 Dec 2020, In: Surface Topography: Metrology and Properties. 8, 4, 12 p., 045030.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile13 Downloads (Pure) -
Step height standards based on self-assembly for 3D metrology of biological samples
Heikkinen, V., Kassamakov, I., Viitala, T., Järvinen, M., Vainikka, T., Nolvi, A., Bermúdez, C., Artigas, R., Martinez, P., Korpelainen, V., Lassila, A. & Hæggström, E., Sep 2020, In: Measurement Science and Technology. 31, 9, 094008.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access -
High-Accuracy autocollimator calibration by interferometric 2D angle generator
Heikkinen, V., Byman, V., Shpak, M., Geckeler, R., Just, A., Krause, M., Schumann, M. & Lassila, A., 9 Sep 2019, Advances in Metrology for X-Ray and EUV Optics VIII. Assoufid, L., Ohashi, H. & Asundi, A. K. (eds.). International Society for Optics and Photonics SPIE, 1110903. (Proceedings of SPIE, Vol. 11109).Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
1 Citation (Scopus) -
Material standards design for minimum zone fitting of freeform optics
Arezki, Y., Lepretre, F., Psota, P., Su, R., Heikkinen, V., Zhang, X., Cai, N., Bitou, Y., Leach, R., Lédl, V., Anwer, N., Mehdi-Souzani, C. & Nouira, H., Jun 2019, 19th International Conference of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2019. Leach, R. K., Billington, D., Nisbet, C. & Phillips, D. (eds.). Euspen, p. 264-267Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
1 Citation (Scopus)