Projects per year
Search results
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Active
ADAM: Application of digital-metrological twins for emerging measurement technology in advanced manufacturing
Hemming, B. (Manager), Heikkinen, V. (Participant) & Teir, L. (Participant)
1/09/24 → 31/08/27
Project: EU project
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Finished
TracOptic: Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors
Heikkinen, V. (Manager)
1/06/21 → 31/05/24
Project: EU project
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NanoXSpot: Measurement of the focal spot size on X-ray tubes with spot sizes down to 100 nm
Korpelainen, V. (Manager) & Heikkinen, V. (Participant)
1/07/19 → 30/06/22
Project: EU project
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FreeFORM: Reference algorithms and metrology on aspherical and freeform lenses
Heikkinen, V. (Manager)
1/06/16 → 31/05/19
Project: EU project