Projects per year
Personal profile
Education/Academic qualification
Natural sciences, Doctorate
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- 1 Similar Profiles
Collaborations and top research areas from the last five years
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SensMonCT II: Advanced detail sensitivity monitoring by new concepts to improve the reliability of safety relevant products using industrial computed tomography
Korpelainen, V. (Manager), Sauvet, B. (Participant) & Teir, L. (Participant)
1/06/24 → 31/05/27
Project: EU project
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MetExSPM: Traceability of localised functional properties of nanostructures with high-speed scanning probe microscopy
Korpelainen, V. (Manager), Lassila, A. (Owner), Sauvet, B. (Participant), Nysten, J. (Participant), Byman, V. (Participant) & Nyholm, K. (Participant)
1/09/21 → 31/08/24
Project: EU project
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ATMOC: Traceable metrology of soft-X-ray to IR optical constants and nanofilms for advanced manufacturing
Lassila, A. (Manager), Korpelainen, V. (Participant) & Nysten, J. (Participant)
1/07/21 → 30/06/24
Project: EU project
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NanoXSpot: Measurement of the focal spot size on X-ray tubes with spot sizes down to 100 nm
Korpelainen, V. (Manager) & Heikkinen, V. (Participant)
1/07/19 → 30/06/22
Project: EU project
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METVES II: Standardisation of concentration measurements of extracellular vesicles for medical diagnoses
Korpelainen, V. (Manager) & Nysten, J. (Participant)
1/06/19 → 30/11/22
Project: EU project
Research output
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Artificial neural network assisted spectral scatterometry for grating quality control
Mattila, A. (Corresponding Author), Nysten, J., Heikkinen, V., Kilpi, J., Korpelainen, V., Hansen, P.-E., Karvinen, P., Kuittinen, M. & Lassila, A., 31 May 2024, In: Measurement Science and Technology. 35, 8, 085025.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile19 Downloads (Pure) -
Comparing novel small-angle x-ray scattering approaches for absolute size and number concentration measurements of spherical SiO2 particles to established methods
Schürmann, R., Gaál, A., Sikora, A., Ojeda, D., Bartczak, D., Goenaga-Infante, H., Korpelainen, V., Sauvet, B., Deumer, J., Varga, Z. & Gollwitzer, C., 16 Sept 2024, In: Nanotechnology. 35, 38, 385701.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access -
Stitching accuracy in large area scanning probe microscopy
Klapetek, P., Nečas, D., Heaps, E., Sauvet, B., Klapetek, V., Valtr, M., Korpelainen, V. & Yacoot, A., Dec 2024, In: Measurement Science and Technology. 35, 12, 125026.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access -
Traceable characterization of hollow organosilica beads as potential reference materials for extracellular vesicle measurements with optical techniques
Deumer, J. (Corresponding Author), Schürmann, R., Gaál, A., Varga, Z., Bettin, B., van der Pol, E., Nieuwland, R., Ojeda, D., Sikora, A., Bartczak, D., Goenaga-Infante, H., Noireaux, J., Khakpour, M., Korpelainen, V. & Gollwitzer, C., 22 Jan 2024, In: Discover Nano. 19, 1, p. 14 17 p., 14.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access2 Citations (Scopus) -
Characterization of PillarHall test chip structures using a reflectometry technique
Danilenko, A. (Corresponding Author), Rastgou, M., Manoocheri, F., Kinnunen, J., Korpelainen, V., Lassila, A. & Ikonen, E., Sept 2023, In: Measurement Science and Technology. 34, 9, 094006.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access1 Citation (Scopus)
Activities
- 1 Conference presentation
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Thin-Film Conformality Analysis, Reliability and Modeling using All-Silicon Lateral High Aspect Ratio Structures
Ylivaara, O. M. E. (Speaker), Korpelainen, V. (Speaker), Ylilammi, M. (Speaker) & Puurunen, R. L. (Speaker)
31 Jul 2018Activity: Talk or presentation types › Conference presentation