Personal profile
Education/Academic qualification
Natural sciences, Doctorate
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- 1 Similar Profiles
Collaborations and top research areas from the last five years
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DINAMO: Digitalisation route for dimensional nanometrology
Korpelainen, V. (Manager)
1/06/25 → 31/05/28
Project: EU project
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SensMonCT II: Advanced detail sensitivity monitoring by new concepts to improve the reliability of safety relevant products using industrial computed tomography
Korpelainen, V. (Manager), Sauvet, B. (Participant) & Martin-Teir, L. (Participant)
1/06/24 → 31/05/27
Project: EU project
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MetExSPM: Traceability of localised functional properties of nanostructures with high-speed scanning probe microscopy
Korpelainen, V. (Manager), Lassila, A. (Owner), Sauvet, B. (Participant), Nysten, J. (Participant), Byman, V. (Participant) & Nyholm, K. (Participant)
1/09/21 → 31/08/24
Project: EU project
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ATMOC: Traceable metrology of soft-X-ray to IR optical constants and nanofilms for advanced manufacturing
Lassila, A. (Manager), Korpelainen, V. (Participant) & Nysten, J. (Participant)
1/07/21 → 30/06/24
Project: EU project
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NanoXSpot: Measurement of the focal spot size on X-ray tubes with spot sizes down to 100 nm
Korpelainen, V. (Manager) & Heikkinen, V. (Participant)
1/07/19 → 30/06/22
Project: EU project
Research output
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Characterisation of Complex Multilayer Nanostructures with High Aspect Ratio
Ikonen, E., Danilenko, A., Rastgou, M., Manoocheri, F., Kinnunen, J., Korpelainen, V. & Lassila, A., 7 Apr 2026, In: Physica Status Solidi A: Applications and Materials Science. 223, 7, e202501022.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access -
3-axis force compensated piezo stage combination for high-speed SPM
Thiesler, J., Moehler, F., Marth, H., Schröder, M., Korpelainen, V. & Dai, G., 2025, In: Measurement Science and Technology. 36, 1, 015049.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access2 Link opens in a new tab Citations (Scopus) -
Application of active piezoresistive cantilevers in high-eigenmode surface imaging
Pruchnik, B., Badura, D., Kopczyński, W., Czułek, D., Rangelow, I. W., Korpelainen, V., Sierakowski, A., Yacoot, A. & Gotszalk, T., 31 Jan 2025, In: Measurement Science and Technology. 36, 1, 016020.Research output: Contribution to journal › Article › Scientific › peer-review
Open Access2 Link opens in a new tab Citations (Scopus) -
Development and testing of a novel Graphene Based Thermal Strap
Hogstrom, R., Tabandeh, S., Sandberg, H., Hamalainen, J., Viitanen, T., Jarvinen, A. & Korpelainen, V., 2025, 2025 IEEE International Workshop on Metrology for AeroSpace, MetroAeroSpace 2025 - Proceedings. IEEE Institute of Electrical and Electronic Engineers, p. 436-441 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
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Editorial for the MST Special Issue NanoScale 2023
Korpelainen, V., Lassila, A., Brand, U. & Dziomba, T., 30 Apr 2025, In: Measurement Science and Technology. 36, 4, 040201.Research output: Contribution to journal › Other journal contribution › Scientific
Open Access
Activities
- 1 Conference presentation
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Thin-Film Conformality Analysis, Reliability and Modeling using All-Silicon Lateral High Aspect Ratio Structures
Ylivaara, O. M. E. (Speaker), Korpelainen, V. (Speaker), Ylilammi, M. (Speaker) & Puurunen, R. L. (Speaker)
31 Jul 2018Activity: Talk or presentation types › Conference presentation
Press/Media
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Kohti uutta sekuntia – Suomessa kehitetään maailman tarkimpia atomikelloja
Wallin, A., Korpelainen, V. & Heinonen, M.
11/07/25
1 Media contribution
Press/Media: Press / Media