Metrology for highly-parallel manufacturing

    Project: EU project

    Project Details

    Description

    Tools for measuring large-substrate, fine-feature printed electronics.

    New metrology is needed to improve the accuracy and efficiency of highly-parallel manufacturing of
    advanced products in various new areas.

    Project improves large-substrate, fine feature manufacturing processes such as roll-to-roll
    printed electronics by delivering inline metrology tools, traceability and standards.

    VTT MIKES develops lateral chromatic imaging for traceable topography measurement on a moving substrate and methods for monitoring flexible substrates to verify registration.


    Call 2014: Metrology for Industry

    This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.
    AcronymMetHPM
    StatusFinished
    Effective start/end date1/05/15 → 30/04/18

    Collaborative partners

    • National Physics Laboratory (NPL) (lead)
    • Danish National Metrology Institute (DFM) (Project partner)
    • National Metrological Institute (INRIM) (Project partner)
    • Dutch Metrology Institute (VSL) (Project partner)
    • Loughborough University (Project partner)
    • NIL Technology ApS (Project partner)
    • University of Nottingham (Project partner)
    • University of Oulu (Project partner)
    • VTT Technical Research Centre of Finland
    • Cranfield University (Project partner)
    • Focalspec Oy (Project partner)
    • IBS Precision Engineering BV (Project partner)
    • Offcode Oy (Project partner)

    Funding

    • EURAMET e.V.

    Keywords

    • highly-parallel manufacturing
    • printed electronics
    • topography measurement

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