Metrology for highly-parallel manufacturing

Project: EU project

Project Details


Tools for measuring large-substrate, fine-feature printed electronics.

New metrology is needed to improve the accuracy and efficiency of highly-parallel manufacturing of
advanced products in various new areas.

Project improves large-substrate, fine feature manufacturing processes such as roll-to-roll
printed electronics by delivering inline metrology tools, traceability and standards.

VTT MIKES develops lateral chromatic imaging for traceable topography measurement on a moving substrate and methods for monitoring flexible substrates to verify registration.

Call 2014: Metrology for Industry

This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.
Effective start/end date1/05/1530/04/18

Collaborative partners

  • National Physical Laboratory (NPL) (lead)
  • BA66 National metrology institute VTT MIKES
  • Danish National Metrology Institute (DFM) (Project partner)
  • National Metrological Institute (INRIM) (Project partner)
  • Dutch Metrology Institute (VSL) (Project partner)
  • Loughborough University (Project partner)
  • NIL Technology ApS (Project partner)
  • University of Nottingham (Project partner)
  • University of Oulu (Project partner)
  • VTT Technical Research Centre of Finland
  • Cranfield University (Project partner)
  • Focalspec Oy (Project partner)
  • IBS Precision Engineering BV (Project partner)
  • Offcode Oy (Project partner)


  • EURAMET e.V.


  • highly-parallel manufacturing
  • printed electronics
  • topography measurement