Tools for measuring large-substrate, fine-feature printed electronics.
New metrology is needed to improve the accuracy and efficiency of highly-parallel manufacturing of
advanced products in various new areas.
Project improves large-substrate, fine feature manufacturing processes such as roll-to-roll
printed electronics by delivering inline metrology tools, traceability and standards.
VTT MIKES develops lateral chromatic imaging for traceable topography measurement on a moving substrate and methods for monitoring flexible substrates to verify registration.
Call 2014: Metrology for Industry
This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.