Metrology for highly-parallel manufacturing

Project: EU project

Project Details

Description

Tools for measuring large-substrate, fine-feature printed electronics.

New metrology is needed to improve the accuracy and efficiency of highly-parallel manufacturing of
advanced products in various new areas.

Project improves large-substrate, fine feature manufacturing processes such as roll-to-roll
printed electronics by delivering inline metrology tools, traceability and standards.

VTT MIKES develops lateral chromatic imaging for traceable topography measurement on a moving substrate and methods for monitoring flexible substrates to verify registration.


Call 2014: Metrology for Industry

This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.
AcronymMetHPM
StatusFinished
Effective start/end date1/05/1530/04/18

Funding

  • EURAMET e.V.

Keywords

  • highly-parallel manufacturing
  • printed electronics
  • topography measurement