Strengthening the metrology for optical surfaces.
The use of aspheres and freeforms is growing rapidly, because of their unmatched optical performance. Thus, there is an urgent need to strengthen metrology for optical surfaces.
Project develops reference algorithms, and standards as well as traceable metrology for aspherical and freeform optical elements.
VTT MIKES builds an instrument to measure aspherical and freeform elements with a few tens of nanometre accuracy.
Call 2015: SI Broader Scope
This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.