Reference algorithms and metrology on aspherical and freeform lenses

Heikkinen, Ville (Manager)

Project: EU project

1 Conference article in proceedings
1 Article

2 results

2020
Multi-sensor optical profilometer for measurement of large freeforms at nm-level uncertainty
Heikkinen, V., Nysten, J., Byman, V., Hemming, B. & Lassila, A., 21 Dec 2020, In: Surface Topography: Metrology and Properties. 8, 4, 12 p., 045030.
Research output: Contribution to journal › Article › Scientific › peer-review

Open Access
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4 Citations (Scopus)

82 Downloads (Pure)