Projects per year
Project Details
Description
Supporting roughness and dimensional metrology in industry
Optical measuring systems are widespread in surface and coordinate metrology. They are fast, with high resolution, contactless, and non-destructive, but often not traceable due to the complexity of the interaction between the measurand and measuring system.
Project will characterize 3D optical microscopes and coordinate measuring machines (CMM)s with optical point sensors to enable traceable 3D roughness and dimensional measurements.
VTT MIKES will provide a ball bar and bearings for dimensional measurements and surface characterisation as well as characterise its freeform instrument equipped with confocal
microscopy using different calibration standards.
Call 2020: Metrology for Industry
This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.
Optical measuring systems are widespread in surface and coordinate metrology. They are fast, with high resolution, contactless, and non-destructive, but often not traceable due to the complexity of the interaction between the measurand and measuring system.
Project will characterize 3D optical microscopes and coordinate measuring machines (CMM)s with optical point sensors to enable traceable 3D roughness and dimensional measurements.
VTT MIKES will provide a ball bar and bearings for dimensional measurements and surface characterisation as well as characterise its freeform instrument equipped with confocal
microscopy using different calibration standards.
Call 2020: Metrology for Industry
This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.
| Acronym | TracOptic |
|---|---|
| Status | Active |
| Effective start/end date | 1/06/21 → 31/05/24 |
Collaborative partners
- BA66 National metrology institute VTT MIKES
- German National Metrology Institute (lead)
- Centro Español de Metrología (CEM) (Project partner)
- Danish National Metrology Institute (DFM)
- Central Office of Measures (GUM) (Project partner)
- National Metrological Institute (INRIM) (Project partner)
- Laboratoire National de Métrologie et d'Essais (LNE) (Project partner)
- RISE Research Institutes of Sweden (Project partner)
- Dutch Metrology Institute (VSL) (Project partner)
- Centro Ricerche Fiat (CFR) (Project partner)
- Friedrich-Alexander-Universität Erlangen-Nürnberg (Project partner)
- Eastern Switzerland University of Applied Sciences (Project partner)
- Fundación Tekniker (Project partner)
- Clausthal University of Technology (Project partner)
- Chemnitz University of Technology (TU Chemnitz) (Project partner)
- University of Kaiserslautern (Project partner)
- University of Kassel (Project partner)
- University of Nottingham (Project partner)
- University of Stuttgart (Project partner)
- Alicona Imaging GmbH (Project partner)
- Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH (Project partner)
- twip optical solutions GmbH (Project partner)
- Leipzig University (Project partner)
- Zygo Corporation (Project partner)
Funding
- EURAMET e.V.
Keywords
- 3D optical microscopy
- roughness measurement
- dimensional measurement
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.
Projects
- 1 Active
-
EMPIR: European Metrology Programme for Innovation and Research (EMPIR)
15/05/14 → 31/12/24
Project: EU project