Traceable metrology of soft-X-ray to IR optical constants and nanofilms for advanced manufacturing

Tools for the development of optical materials with tailored properties

Optics and semiconductor industries make increasing use of innovative materials and complex nanostructures. However, the optical properties of these are currently difficult to measure and often not accurately known.

Project develops traceable metrology and advanced mathematical methods to characterize these materials for wavelength ranges from soft-X ray to IR.

VTT MIKES will design, fabricate and test reference samples and further develop its ellipsometer and scatterometer for traceable characterization of optical constants.

Call 2020: Metrology for Industry

This project has received funding from the EMPIR programme co-financed by the Participating States and from the European Union’s Horizon 2020 research and innovation programme.