16-term error model in reciprocal systems

K. Silvonen; K. Dahlberg; Tero Kiuru

doi:10.1109/TMTT.2012.2217150

16-term error model in reciprocal systems

K. Silvonen, K. Dahlberg, Tero Kiuru

Research output: Contribution to journal › Article › Scientific › peer-review

5 Citations (Scopus)

Abstract

By taking reciprocity of the error network into account, full and accurate calibration of a 16-term error model can be performed using only four two-port calibration standards or termination pairs. Moreover, there is no need for a nonsymmetrical calibration standard that is strictly required in a more conventional five-standard calibration. Commercially available standard substrates can thus be used. Detailed theory of the reciprocal 16-term error model and a new calibration method are presented. Reciprocity assumption is valid in on-wafer and other measurements when two-tier calibration is applied. However, the calibration scheme allows measurement of nonreciprocal devices too. The usefulness of the new method is confirmed by practical wideband on-wafer measurements.

Original language	English
Pages (from-to)	3551-3558
Number of pages	7
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	60
Issue number	11
DOIs	https://doi.org/10.1109/TMTT.2012.2217150
Publication status	Published - 2012
MoE publication type	A1 Journal article-refereed

Keywords

16-term error model
calibration
network analyzer (NWA)
on-wafer measurement
RF device modeling
scattering parameter measurement

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abstract = "By taking reciprocity of the error network into account, full and accurate calibration of a 16-term error model can be performed using only four two-port calibration standards or termination pairs. Moreover, there is no need for a nonsymmetrical calibration standard that is strictly required in a more conventional five-standard calibration. Commercially available standard substrates can thus be used. Detailed theory of the reciprocal 16-term error model and a new calibration method are presented. Reciprocity assumption is valid in on-wafer and other measurements when two-tier calibration is applied. However, the calibration scheme allows measurement of nonreciprocal devices too. The usefulness of the new method is confirmed by practical wideband on-wafer measurements.",

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T1 - 16-term error model in reciprocal systems

AU - Silvonen, K.

AU - Dahlberg, K.

AU - Kiuru, Tero

PY - 2012

Y1 - 2012

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AB - By taking reciprocity of the error network into account, full and accurate calibration of a 16-term error model can be performed using only four two-port calibration standards or termination pairs. Moreover, there is no need for a nonsymmetrical calibration standard that is strictly required in a more conventional five-standard calibration. Commercially available standard substrates can thus be used. Detailed theory of the reciprocal 16-term error model and a new calibration method are presented. Reciprocity assumption is valid in on-wafer and other measurements when two-tier calibration is applied. However, the calibration scheme allows measurement of nonreciprocal devices too. The usefulness of the new method is confirmed by practical wideband on-wafer measurements.

KW - 16-term error model

KW - calibration

KW - network analyzer (NWA)

KW - on-wafer measurement

KW - RF device modeling

KW - scattering parameter measurement

U2 - 10.1109/TMTT.2012.2217150

DO - 10.1109/TMTT.2012.2217150

M3 - Article

VL - 60

SP - 3551

EP - 3558

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

IS - 11

ER -