Abstract
By taking reciprocity of the error network into account, full and accurate calibration of a 16-term error model can be performed using only four two-port calibration standards or termination pairs. Moreover, there is no need for a nonsymmetrical calibration standard that is strictly required in a more conventional five-standard calibration. Commercially available standard substrates can thus be used. Detailed theory of the reciprocal 16-term error model and a new calibration method are presented. Reciprocity assumption is valid in on-wafer and other measurements when two-tier calibration is applied. However, the calibration scheme allows measurement of nonreciprocal devices too. The usefulness of the new method is confirmed by practical wideband on-wafer measurements.
| Original language | English |
|---|---|
| Pages (from-to) | 3551-3558 |
| Number of pages | 7 |
| Journal | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 60 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 2012 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- 16-term error model
- calibration
- network analyzer (NWA)
- on-wafer measurement
- RF device modeling
- scattering parameter measurement
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Silvonen, K., Dahlberg, K., & Kiuru, T. (2012). 16-term error model in reciprocal systems. IEEE Transactions on Microwave Theory and Techniques, 60(11), 3551-3558. https://doi.org/10.1109/TMTT.2012.2217150