Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 3551-3558 |
| Number of pages | 7 |
| Journal | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 60 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 2012 |
| MoE publication type | A1 Journal article-refereed |
Fingerprint
Keywords
- 16-term error model
- calibration
- network analyzer (NWA)
- on-wafer measurement
- RF device modeling
- scattering parameter measurement
Cite this
}
16-term error model in reciprocal systems. / Silvonen, K.; Dahlberg, K.; Kiuru, Tero.
In: IEEE Transactions on Microwave Theory and Techniques, Vol. 60, No. 11, 2012, p. 3551-3558.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - 16-term error model in reciprocal systems
AU - Silvonen, K.
AU - Dahlberg, K.
AU - Kiuru, Tero
PY - 2012
Y1 - 2012
N2 - By taking reciprocity of the error network into account, full and accurate calibration of a 16-term error model can be performed using only four two-port calibration standards or termination pairs. Moreover, there is no need for a nonsymmetrical calibration standard that is strictly required in a more conventional five-standard calibration. Commercially available standard substrates can thus be used. Detailed theory of the reciprocal 16-term error model and a new calibration method are presented. Reciprocity assumption is valid in on-wafer and other measurements when two-tier calibration is applied. However, the calibration scheme allows measurement of nonreciprocal devices too. The usefulness of the new method is confirmed by practical wideband on-wafer measurements.
AB - By taking reciprocity of the error network into account, full and accurate calibration of a 16-term error model can be performed using only four two-port calibration standards or termination pairs. Moreover, there is no need for a nonsymmetrical calibration standard that is strictly required in a more conventional five-standard calibration. Commercially available standard substrates can thus be used. Detailed theory of the reciprocal 16-term error model and a new calibration method are presented. Reciprocity assumption is valid in on-wafer and other measurements when two-tier calibration is applied. However, the calibration scheme allows measurement of nonreciprocal devices too. The usefulness of the new method is confirmed by practical wideband on-wafer measurements.
KW - 16-term error model
KW - calibration
KW - network analyzer (NWA)
KW - on-wafer measurement
KW - RF device modeling
KW - scattering parameter measurement
U2 - 10.1109/TMTT.2012.2217150
DO - 10.1109/TMTT.2012.2217150
M3 - Article
VL - 60
SP - 3551
EP - 3558
JO - IEEE Transactions on Microwave Theory and Techniques
JF - IEEE Transactions on Microwave Theory and Techniques
SN - 0018-9480
IS - 11
ER -