16-term error model in reciprocal systems

K. Silvonen, K. Dahlberg, Tero Kiuru

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Abstract

By taking reciprocity of the error network into account, full and accurate calibration of a 16-term error model can be performed using only four two-port calibration standards or termination pairs. Moreover, there is no need for a nonsymmetrical calibration standard that is strictly required in a more conventional five-standard calibration. Commercially available standard substrates can thus be used. Detailed theory of the reciprocal 16-term error model and a new calibration method are presented. Reciprocity assumption is valid in on-wafer and other measurements when two-tier calibration is applied. However, the calibration scheme allows measurement of nonreciprocal devices too. The usefulness of the new method is confirmed by practical wideband on-wafer measurements.
Original languageEnglish
Pages (from-to)3551-3558
Number of pages7
JournalIEEE Transactions on Microwave Theory and Techniques
Volume60
Issue number11
DOIs
Publication statusPublished - 2012
MoE publication typeA1 Journal article-refereed

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Calibration
wafers
broadband
Substrates

Keywords

  • 16-term error model
  • calibration
  • network analyzer (NWA)
  • on-wafer measurement
  • RF device modeling
  • scattering parameter measurement

Cite this

Silvonen, K. ; Dahlberg, K. ; Kiuru, Tero. / 16-term error model in reciprocal systems. In: IEEE Transactions on Microwave Theory and Techniques. 2012 ; Vol. 60, No. 11. pp. 3551-3558.
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16-term error model in reciprocal systems. / Silvonen, K.; Dahlberg, K.; Kiuru, Tero.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 60, No. 11, 2012, p. 3551-3558.

Research output: Contribution to journalArticleScientificpeer-review

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AU - Kiuru, Tero

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KW - 16-term error model

KW - calibration

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KW - RF device modeling

KW - scattering parameter measurement

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