1/f noise in electrical components caused by the positive thermal feedback in self-generating systems

Heikki Seppä, Tuomo Korkolainen, Tapani Ryhänen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Abstract

    The positive thermal feedback in a self-generating system is shown to convert thermally induced white noise into 1/f noise. According to this model the slope of the low frequency noise spectrum is very close to unity since the real component evacuates its heat into the three-dimensional space. The theory predicts that the 1/f noise exceeds white noise below the frequency characterizing both the geometric structure of the component and the thermal properties of the surroundings. Consequently, the uncertainty of the measurement is inversely proportional to the physical size of the component or the standard.
    Original languageEnglish
    Title of host publicationCPEM '88 Digest
    EditorsYasuharu Suematsu
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages59-60
    DOIs
    Publication statusPublished - 1988
    MoE publication typeA4 Article in a conference publication
    EventConference on Precision Electromagnetic Measurements 1988 (CPEM '88) - Tsukuba, Japan
    Duration: 7 Jun 198810 Jun 1988

    Conference

    ConferenceConference on Precision Electromagnetic Measurements 1988 (CPEM '88)
    CountryJapan
    CityTsukuba
    Period7/06/8810/06/88

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    Cite this

    Seppä, H., Korkolainen, T., & Ryhänen, T. (1988). 1/f noise in electrical components caused by the positive thermal feedback in self-generating systems. In Y. Suematsu (Ed.), CPEM '88 Digest (pp. 59-60). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/CPEM.1988.671175