| Original language | English |
|---|---|
| Publication status | Published - 31 Aug 2018 |
| MoE publication type | Not Eligible |
| Event | 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization - Fraunhofer, Dresden, Germany Duration: 31 Jan 2019 → 31 Jan 2019 https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html |
Conference
| Conference | 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization |
|---|---|
| Country | Germany |
| City | Dresden |
| Period | 31/01/19 → 31/01/19 |
| Internet address |
Cite this
Utriainen, M., Puurunen, R. L., Kia, A. M., Esmaeli, S., Mart, C., Haufe, N., & Weinreich, W. (2018). 3D Analysis of Thin Layers by ToF-SIMS. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.
@conference{20cafcc28d7c4a13ba4d40eecd995b0d,
title = "3D Analysis of Thin Layers by ToF-SIMS",
author = "Mikko Utriainen and Puurunen, {Riikka L.} and Kia, {Alireza, M.} and Sajjad Esmaeli and Clemens Mart and Nora Haufe and Wenke Weinreich",
year = "2018",
month = "8",
day = "31",
language = "English",
note = "6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization ; Conference date: 31-01-2019 Through 31-01-2019",
url = "https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html",
}
Utriainen, M, Puurunen, RL, Kia, AM, Esmaeli, S, Mart, C, Haufe, N & Weinreich, W 2018, '3D Analysis of Thin Layers by ToF-SIMS', 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany, 31/01/19 - 31/01/19.
3D Analysis of Thin Layers by ToF-SIMS. / Utriainen, Mikko; Puurunen, Riikka L.; Kia, Alireza, M. (Corresponding author); Esmaeli, Sajjad; Mart, Clemens; Haufe, Nora; Weinreich, Wenke.
2018. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.Research output: Contribution to conference › Conference Abstract › Scientific › peer-review
TY - CONF
T1 - 3D Analysis of Thin Layers by ToF-SIMS
AU - Utriainen, Mikko
AU - Puurunen, Riikka L.
AU - Kia, Alireza, M.
AU - Esmaeli, Sajjad
AU - Mart, Clemens
AU - Haufe, Nora
AU - Weinreich, Wenke
PY - 2018/8/31
Y1 - 2018/8/31
UR - https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html
M3 - Conference Abstract
ER -
Utriainen M, Puurunen RL, Kia AM, Esmaeli S, Mart C, Haufe N et al. 3D Analysis of Thin Layers by ToF-SIMS. 2018. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.