3D Analysis of Thin Layers by ToF-SIMS

Mikko Utriainen, Riikka L. Puurunen, Alireza, M. Kia (Corresponding author), Sajjad Esmaeli, Clemens Mart, Nora Haufe, Wenke Weinreich

    Research output: Contribution to conferenceConference AbstractScientificpeer-review

    Original languageEnglish
    Publication statusPublished - 31 Aug 2018
    MoE publication typeNot Eligible
    Event6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization - Fraunhofer, Dresden, Germany
    Duration: 31 Jan 201931 Jan 2019
    https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html

    Conference

    Conference6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization
    CountryGermany
    CityDresden
    Period31/01/1931/01/19
    Internet address

    Cite this

    Utriainen, M., Puurunen, R. L., Kia, A. M., Esmaeli, S., Mart, C., Haufe, N., & Weinreich, W. (2018). 3D Analysis of Thin Layers by ToF-SIMS. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.
    Utriainen, Mikko ; Puurunen, Riikka L. ; Kia, Alireza, M. ; Esmaeli, Sajjad ; Mart, Clemens ; Haufe, Nora ; Weinreich, Wenke. / 3D Analysis of Thin Layers by ToF-SIMS. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.
    @conference{20cafcc28d7c4a13ba4d40eecd995b0d,
    title = "3D Analysis of Thin Layers by ToF-SIMS",
    author = "Mikko Utriainen and Puurunen, {Riikka L.} and Kia, {Alireza, M.} and Sajjad Esmaeli and Clemens Mart and Nora Haufe and Wenke Weinreich",
    year = "2018",
    month = "8",
    day = "31",
    language = "English",
    note = "6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization ; Conference date: 31-01-2019 Through 31-01-2019",
    url = "https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html",

    }

    Utriainen, M, Puurunen, RL, Kia, AM, Esmaeli, S, Mart, C, Haufe, N & Weinreich, W 2018, '3D Analysis of Thin Layers by ToF-SIMS', 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany, 31/01/19 - 31/01/19.

    3D Analysis of Thin Layers by ToF-SIMS. / Utriainen, Mikko; Puurunen, Riikka L.; Kia, Alireza, M. (Corresponding author); Esmaeli, Sajjad; Mart, Clemens; Haufe, Nora; Weinreich, Wenke.

    2018. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.

    Research output: Contribution to conferenceConference AbstractScientificpeer-review

    TY - CONF

    T1 - 3D Analysis of Thin Layers by ToF-SIMS

    AU - Utriainen, Mikko

    AU - Puurunen, Riikka L.

    AU - Kia, Alireza, M.

    AU - Esmaeli, Sajjad

    AU - Mart, Clemens

    AU - Haufe, Nora

    AU - Weinreich, Wenke

    PY - 2018/8/31

    Y1 - 2018/8/31

    UR - https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html

    M3 - Conference Abstract

    ER -

    Utriainen M, Puurunen RL, Kia AM, Esmaeli S, Mart C, Haufe N et al. 3D Analysis of Thin Layers by ToF-SIMS. 2018. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.