3D Analysis of Thin Layers by ToF-SIMS

Mikko Utriainen, Riikka L. Puurunen, Alireza, M. Kia (Corresponding author), Sajjad Esmaeli, Clemens Mart, Nora Haufe, Wenke Weinreich

    Research output: Contribution to conferenceConference AbstractScientificpeer-review

    Original languageEnglish
    Publication statusPublished - 31 Aug 2018
    MoE publication typeNot Eligible
    Event6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization - Fraunhofer, Dresden, Germany
    Duration: 31 Jan 201931 Jan 2019
    https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html

    Conference

    Conference6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization
    CountryGermany
    CityDresden
    Period31/01/1931/01/19
    Internet address

    Cite this

    Utriainen, M., Puurunen, R. L., Kia, A. M., Esmaeli, S., Mart, C., Haufe, N., & Weinreich, W. (2018). 3D Analysis of Thin Layers by ToF-SIMS. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.