3D Analysis of Thin Layers by ToF-SIMS

Mikko Utriainen, Riikka L. Puurunen, Alireza, M. Kia (Corresponding author), Sajjad Esmaeli, Clemens Mart, Nora Haufe, Wenke Weinreich

Research output: Contribution to conferenceConference AbstractScientificpeer-review

Original languageEnglish
Publication statusPublished - 31 Aug 2018
MoE publication typeNot Eligible
Event6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization - Fraunhofer, Dresden, Germany
Duration: 31 Jan 201931 Jan 2019
https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html

Conference

Conference6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization
CountryGermany
CityDresden
Period31/01/1931/01/19
Internet address

Cite this

Utriainen, M., Puurunen, R. L., Kia, A. M., Esmaeli, S., Mart, C., Haufe, N., & Weinreich, W. (2018). 3D Analysis of Thin Layers by ToF-SIMS. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.
Utriainen, Mikko ; Puurunen, Riikka L. ; Kia, Alireza, M. ; Esmaeli, Sajjad ; Mart, Clemens ; Haufe, Nora ; Weinreich, Wenke. / 3D Analysis of Thin Layers by ToF-SIMS. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.
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title = "3D Analysis of Thin Layers by ToF-SIMS",
author = "Mikko Utriainen and Puurunen, {Riikka L.} and Kia, {Alireza, M.} and Sajjad Esmaeli and Clemens Mart and Nora Haufe and Wenke Weinreich",
year = "2018",
month = "8",
day = "31",
language = "English",
note = "6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization ; Conference date: 31-01-2019 Through 31-01-2019",
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}

Utriainen, M, Puurunen, RL, Kia, AM, Esmaeli, S, Mart, C, Haufe, N & Weinreich, W 2018, '3D Analysis of Thin Layers by ToF-SIMS' 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany, 31/01/19 - 31/01/19, .

3D Analysis of Thin Layers by ToF-SIMS. / Utriainen, Mikko; Puurunen, Riikka L.; Kia, Alireza, M. (Corresponding author); Esmaeli, Sajjad; Mart, Clemens; Haufe, Nora; Weinreich, Wenke.

2018. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.

Research output: Contribution to conferenceConference AbstractScientificpeer-review

TY - CONF

T1 - 3D Analysis of Thin Layers by ToF-SIMS

AU - Utriainen, Mikko

AU - Puurunen, Riikka L.

AU - Kia, Alireza, M.

AU - Esmaeli, Sajjad

AU - Mart, Clemens

AU - Haufe, Nora

AU - Weinreich, Wenke

PY - 2018/8/31

Y1 - 2018/8/31

UR - https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html

M3 - Conference Abstract

ER -

Utriainen M, Puurunen RL, Kia AM, Esmaeli S, Mart C, Haufe N et al. 3D Analysis of Thin Layers by ToF-SIMS. 2018. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Germany.