3D Analysis of Thin Layers by ToF-SIMS

Mikko Utriainen; Riikka L. Puurunen; Alireza, M. Kia; Sajjad Esmaeli; Clemens Mart; Nora Haufe; Wenke Weinreich

3D Analysis of Thin Layers by ToF-SIMS

Mikko Utriainen, Riikka L. Puurunen, Alireza, M. Kia (Corresponding author), Sajjad Esmaeli, Clemens Mart, Nora Haufe, Wenke Weinreich

Research output: Contribution to conference › Conference Abstract › Scientific › peer-review

Original language	English
Publication status	Published - 31 Aug 2018
MoE publication type	Not Eligible
Event	6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization - Fraunhofer, Dresden, Germany Duration: 31 Jan 2019 → 31 Jan 2019 https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html

Conference

Conference	6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization
Country/Territory	Germany
City	Dresden
Period	31/01/19 → 31/01/19
Internet address	https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html

Cite this

@conference{20cafcc28d7c4a13ba4d40eecd995b0d,

title = "3D Analysis of Thin Layers by ToF-SIMS",

author = "Mikko Utriainen and Puurunen, {Riikka L.} and Kia, {Alireza, M.} and Sajjad Esmaeli and Clemens Mart and Nora Haufe and Wenke Weinreich",

year = "2018",

month = aug,

day = "31",

language = "English",

note = "6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization ; Conference date: 31-01-2019 Through 31-01-2019",

url = "https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html",

}

3D Analysis of Thin Layers by ToF-SIMS. / Utriainen, Mikko; Puurunen, Riikka L.; Kia, Alireza, M. (Corresponding author); Esmaeli, Sajjad; Mart, Clemens; Haufe, Nora; Weinreich, Wenke.

2018. Abstract from 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization, Dresden, Saxony, Germany.

Research output: Contribution to conference › Conference Abstract › Scientific › peer-review

TY - CONF

T1 - 3D Analysis of Thin Layers by ToF-SIMS

AU - Utriainen, Mikko

AU - Puurunen, Riikka L.

AU - Kia, Alireza, M.

AU - Esmaeli, Sajjad

AU - Mart, Clemens

AU - Haufe, Nora

AU - Weinreich, Wenke

PY - 2018/8/31

Y1 - 2018/8/31

UR - https://www.nanoanalytik.fraunhofer.de/en/events/6DNS.html

M3 - Conference Abstract

T2 - 6th Dresden Nanoanalysis Symposium: Materials challenges for automotive industry - Micro- and nanoscale characterization

Y2 - 31 January 2019 through 31 January 2019

ER -

3D Analysis of Thin Layers by ToF-SIMS

Conference

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Cite this