60 GHz on-wafer noise parameter measurements using cold-source method

Manu Lahdes, Markku Sipilä, Jussi Tuovinen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    7 Citations (Scopus)


    Noise parameter measurement set-up for 60 GHz is described. The designed and built set-up is based on the cold-source method. Both S- and noise parameters are measured with the set-up. Measurement results of the an InP HEMT noise parameters at 58-62 GHz are shown, as well as accuracy of the results is discussed.
    Original languageEnglish
    Title of host publication49th ARFTG Conference Digest
    PublisherIEEE Institute of Electrical and Electronic Engineers
    ISBN (Electronic)978-1-6654-5030-0
    ISBN (Print)978-0-7803-5686-3
    Publication statusPublished - 1997
    MoE publication typeA4 Article in a conference publication
    Event49th ARFTG Conference - Denver, United States
    Duration: 13 Jun 199713 Jun 1997


    Conference49th ARFTG Conference
    Country/TerritoryUnited States


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