60 GHz on-wafer noise parameter measurements using cold-source method

Manu Lahdes, Markku Sipilä, Jussi Tuovinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

7 Citations (Scopus)

Abstract

Noise parameter measurement set-up for 60 GHz is described. The designed and built set-up is based on the cold-source method. Both S- and noise parameters are measured with the set-up. Measurement results of the an InP HEMT noise parameters at 58-62 GHz are shown, as well as accuracy of the results is discussed.
Original languageEnglish
Title of host publicationDigest of 49th ARFTG Conference
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages146-154
ISBN (Print)0-7803-5686-1
DOIs
Publication statusPublished - 1997
MoE publication typeA4 Article in a conference publication
Event49th ARFTG Conference - Denver, United States
Duration: 13 Jun 199713 Jun 1997

Conference

Conference49th ARFTG Conference
CountryUnited States
CityDenver
Period13/06/9713/06/97

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    Lahdes, M., Sipilä, M., & Tuovinen, J. (1997). 60 GHz on-wafer noise parameter measurements using cold-source method. In Digest of 49th ARFTG Conference (pp. 146-154). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ARFTG.1997.327223