60 GHz on-wafer noise parameter measurements using cold-source method

Manu Lahdes, Markku Sipilä, Jussi Tuovinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

7 Citations (Scopus)


Noise parameter measurement set-up for 60 GHz is described. The designed and built set-up is based on the cold-source method. Both S- and noise parameters are measured with the set-up. Measurement results of the an InP HEMT noise parameters at 58-62 GHz are shown, as well as accuracy of the results is discussed.
Original languageEnglish
Title of host publicationDigest of 49th ARFTG Conference
PublisherIEEE Institute of Electrical and Electronic Engineers
ISBN (Print)0-7803-5686-1
Publication statusPublished - 1997
MoE publication typeA4 Article in a conference publication
Event49th ARFTG Conference - Denver, United States
Duration: 13 Jun 199713 Jun 1997


Conference49th ARFTG Conference
CountryUnited States

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