60 GHz on-wafer noise parameter measurements using cold-source method

Manu Lahdes; Markku Sipilä; Jussi Tuovinen

doi:10.1109/ARFTG.1997.327223

60 GHz on-wafer noise parameter measurements using cold-source method

Manu Lahdes, Markku Sipilä, Jussi Tuovinen

VTT (former employee or external)

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

7 Citations (Scopus)

Abstract

Noise parameter measurement set-up for 60 GHz is described. The designed and built set-up is based on the cold-source method. Both S- and noise parameters are measured with the set-up. Measurement results of the an InP HEMT noise parameters at 58-62 GHz are shown, as well as accuracy of the results is discussed.

Original language	English
Title of host publication	49th ARFTG Conference Digest
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	146-154
ISBN (Electronic)	978-1-6654-5030-0
ISBN (Print)	978-0-7803-5686-3
DOIs	https://doi.org/10.1109/ARFTG.1997.327223
Publication status	Published - 1997
MoE publication type	A4 Article in a conference publication
Event	49th ARFTG Conference - Denver, United States Duration: 13 Jun 1997 → 13 Jun 1997

Conference

Conference	49th ARFTG Conference
Country/Territory	United States
City	Denver
Period	13/06/97 → 13/06/97

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10.1109/ARFTG.1997.327223

Cite this

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title = "60 GHz on-wafer noise parameter measurements using cold-source method",

abstract = "Noise parameter measurement set-up for 60 GHz is described. The designed and built set-up is based on the cold-source method. Both S- and noise parameters are measured with the set-up. Measurement results of the an InP HEMT noise parameters at 58-62 GHz are shown, as well as accuracy of the results is discussed.",

author = "Manu Lahdes and Markku Sipil{\"a} and Jussi Tuovinen",

year = "1997",

doi = "10.1109/ARFTG.1997.327223",

language = "English",

isbn = "978-0-7803-5686-3",

pages = "146--154",

booktitle = "49th ARFTG Conference Digest",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "49th ARFTG Conference ; Conference date: 13-06-1997 Through 13-06-1997",

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TY - GEN

T1 - 60 GHz on-wafer noise parameter measurements using cold-source method

AU - Lahdes, Manu

AU - Sipilä, Markku

AU - Tuovinen, Jussi

PY - 1997

Y1 - 1997

N2 - Noise parameter measurement set-up for 60 GHz is described. The designed and built set-up is based on the cold-source method. Both S- and noise parameters are measured with the set-up. Measurement results of the an InP HEMT noise parameters at 58-62 GHz are shown, as well as accuracy of the results is discussed.

AB - Noise parameter measurement set-up for 60 GHz is described. The designed and built set-up is based on the cold-source method. Both S- and noise parameters are measured with the set-up. Measurement results of the an InP HEMT noise parameters at 58-62 GHz are shown, as well as accuracy of the results is discussed.

U2 - 10.1109/ARFTG.1997.327223

DO - 10.1109/ARFTG.1997.327223

M3 - Conference article in proceedings

SN - 978-0-7803-5686-3

SP - 146

EP - 154

BT - 49th ARFTG Conference Digest

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 49th ARFTG Conference

Y2 - 13 June 1997 through 13 June 1997

ER -

60 GHz on-wafer noise parameter measurements using cold-source method

Abstract

Conference

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