@inproceedings{2025fc0959de4d36bae69806d61982ae,
title = "A calibration-free method to assess the quality of standards for THz on-wafer measurements",
abstract = "A method to assess the quality of the calibration standards has been developed and tested. The actual response of the tested transmission lines for LRRM-16 calibration approach has been simulated in HFSS environment, fabricated, and tested with on-wafer measurement setup. The method for quality assessment is based on the properties of similar matrices, that compares traces and determinants of the S-parameters products for fabricated and simulated structures.",
author = "Maxim Masyukov and Irina Nefedova and Aleksi Tamminen and Kimmo Silvonen and Juan Cabello-Sanchez and Mikko Varonen and Mikko Kantanen and Helena Rodilla and Jan Stake and Zachary Taylor",
note = "Funding Information: M.M. acknowledges the IEEE MTT Society for the financial support of this study, as well as Ms. Divya Jayasankar and Mr. Yin Zeng for their help and stimulating discussions. ; 47th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2022 ; Conference date: 28-08-2022 Through 02-09-2022",
year = "2022",
month = sep,
day = "26",
doi = "10.1109/IRMMW-THz50927.2022.9895704",
language = "English",
isbn = "978-1-7281-9428-8",
series = "International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz",
publisher = "IEEE Institute of Electrical and Electronic Engineers",
booktitle = "IRMMW-THz 2022",
address = "United States",
}