Skip to main navigation Skip to search Skip to main content

A calibration-free method to assess the quality of standards for THz on-wafer measurements

  • Maxim Masyukov
  • , Irina Nefedova
  • , Aleksi Tamminen
  • , Kimmo Silvonen
  • , Juan Cabello-Sanchez
  • , Mikko Varonen
  • , Mikko Kantanen
  • , Helena Rodilla
  • , Jan Stake
  • , Zachary Taylor
    • Aalto University
    • Chalmers University of Technology

    Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

    Fingerprint

    Dive into the research topics of 'A calibration-free method to assess the quality of standards for THz on-wafer measurements'. Together they form a unique fingerprint.
    Sort by

    Engineering

    Keyphrases

    INIS

    Physics