A design-oriented charge-based simplified model for FDSOI MOSFETs

Alessandro Pezzotta*, Farzan Jazaeri, Heorhii Bohuslavskyi, Louis Hutin, Christian Enz

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

3 Citations (Scopus)

Abstract

In this paper a design-oriented model for asymmetrical double-gate (ADG) MOSFETs is proposed. Including the back-gate effect into the original simplified EKV bulk model requires only one additional parameter to the existing four, and extends the simplified EKV model to FDSOI processes. This will help the designer to find the right trade-off in terms of design parameters, including the back-gate biasing. A comparison with measurement results from a 28-nm FDSOI CMOS process is provided, assessing the excellent accuracy of the proposed.
Original languageEnglish
Title of host publication2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018
EditorsViktor Sverdlov, Carlos Sampedro, Luca Donetti, Francisco Gamiz
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages1-4
Number of pages4
ISBN (Electronic)978-1-5386-4811-7
DOIs
Publication statusPublished - Mar 2018
MoE publication typeA4 Article in a conference publication

Keywords

  • FDSOI
  • back-gate
  • modeling
  • simplified EKV

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