Abstract
A method to define the accuracy of the known data of the
calibration standards, presented in this article, is
based on the reciprocity conditions of the error
parameters. It can be seen that any error in calibration
standards' definition leads to increasing apparent
nonreciprocity in the error terms of passive test
fixtures. It is an easy method to check the accuracy of
the known data of the standards without any extra
measurements or calculations. The method is demonstrated
by simulations and wideband two-tier on-wafer
measurements
Original language | English |
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Pages (from-to) | 1036-1040 |
Journal | Microwave and Optical Technology Letters |
Volume | 56 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2014 |
MoE publication type | A1 Journal article-refereed |
Keywords
- 16-term error model
- calibration
- calibration standards
- millimeter waves
- on-wafer measurement