A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network

K Dahlberg (Corresponding Author), K Silvonen, Tero Kiuru

    Research output: Contribution to journal › Article › Scientific › peer-review

    1 Citation (Scopus)

    Abstract

    A method to define the accuracy of the known data of the calibration standards, presented in this article, is based on the reciprocity conditions of the error parameters. It can be seen that any error in calibration standards' definition leads to increasing apparent nonreciprocity in the error terms of passive test fixtures. It is an easy method to check the accuracy of the known data of the standards without any extra measurements or calculations. The method is demonstrated by simulations and wideband two-tier on-wafer measurements
    Original languageEnglish
    Pages (from-to)1036-1040
    JournalMicrowave and Optical Technology Letters
    Volume56
    Issue number5
    DOIs
    Publication statusPublished - 2014
    MoE publication typeA1 Journal article-refereed

    Fingerprint

    Calibration
    Testing
    fixtures
    wafers
    broadband
    simulation

    Keywords

    • 16-term error model
    • calibration
    • calibration standards
    • millimeter waves
    • on-wafer measurement

    Cite this

    Dahlberg, K ; Silvonen, K ; Kiuru, Tero. / A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network. In: Microwave and Optical Technology Letters. 2014 ; Vol. 56, No. 5. pp. 1036-1040.
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    abstract = "A method to define the accuracy of the known data of the calibration standards, presented in this article, is based on the reciprocity conditions of the error parameters. It can be seen that any error in calibration standards' definition leads to increasing apparent nonreciprocity in the error terms of passive test fixtures. It is an easy method to check the accuracy of the known data of the standards without any extra measurements or calculations. The method is demonstrated by simulations and wideband two-tier on-wafer measurements",
    keywords = "16-term error model, calibration, calibration standards, millimeter waves, on-wafer measurement",
    author = "K Dahlberg and K Silvonen and Tero Kiuru",
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    Dahlberg, K, Silvonen, K & Kiuru, T 2014, 'A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network', Microwave and Optical Technology Letters, vol. 56, no. 5, pp. 1036-1040. https://doi.org/10.1002/mop.28251

    A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network. / Dahlberg, K (Corresponding Author); Silvonen, K; Kiuru, Tero.

    In: Microwave and Optical Technology Letters, Vol. 56, No. 5, 2014, p. 1036-1040.

    Research output: Contribution to journal › Article › Scientific › peer-review

    TY - JOUR

    T1 - A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network

    AU - Dahlberg, K

    AU - Silvonen, K

    AU - Kiuru, Tero

    PY - 2014

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    N2 - A method to define the accuracy of the known data of the calibration standards, presented in this article, is based on the reciprocity conditions of the error parameters. It can be seen that any error in calibration standards' definition leads to increasing apparent nonreciprocity in the error terms of passive test fixtures. It is an easy method to check the accuracy of the known data of the standards without any extra measurements or calculations. The method is demonstrated by simulations and wideband two-tier on-wafer measurements

    AB - A method to define the accuracy of the known data of the calibration standards, presented in this article, is based on the reciprocity conditions of the error parameters. It can be seen that any error in calibration standards' definition leads to increasing apparent nonreciprocity in the error terms of passive test fixtures. It is an easy method to check the accuracy of the known data of the standards without any extra measurements or calculations. The method is demonstrated by simulations and wideband two-tier on-wafer measurements

    KW - 16-term error model

    KW - calibration

    KW - calibration standards

    KW - millimeter waves

    KW - on-wafer measurement

    U2 - 10.1002/mop.28251

    DO - 10.1002/mop.28251

    M3 - Article

    VL - 56

    SP - 1036

    EP - 1040

    JO - Microwave and Optical Technology Letters

    JF - Microwave and Optical Technology Letters

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    Dahlberg K, Silvonen K, Kiuru T. A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network. Microwave and Optical Technology Letters. 2014;56(5):1036-1040. https://doi.org/10.1002/mop.28251

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