A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network

K Dahlberg (Corresponding Author), K Silvonen, Tero Kiuru

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)

Abstract

A method to define the accuracy of the known data of the calibration standards, presented in this article, is based on the reciprocity conditions of the error parameters. It can be seen that any error in calibration standards' definition leads to increasing apparent nonreciprocity in the error terms of passive test fixtures. It is an easy method to check the accuracy of the known data of the standards without any extra measurements or calculations. The method is demonstrated by simulations and wideband two-tier on-wafer measurements
Original languageEnglish
Pages (from-to)1036-1040
JournalMicrowave and Optical Technology Letters
Volume56
Issue number5
DOIs
Publication statusPublished - 2014
MoE publication typeA1 Journal article-refereed

Fingerprint

Calibration
Testing
fixtures
wafers
broadband
simulation

Keywords

  • 16-term error model
  • calibration
  • calibration standards
  • millimeter waves
  • on-wafer measurement

Cite this

@article{3eb8acef0e36419c9b6b5d8fbd0a2977,
title = "A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network",
abstract = "A method to define the accuracy of the known data of the calibration standards, presented in this article, is based on the reciprocity conditions of the error parameters. It can be seen that any error in calibration standards' definition leads to increasing apparent nonreciprocity in the error terms of passive test fixtures. It is an easy method to check the accuracy of the known data of the standards without any extra measurements or calculations. The method is demonstrated by simulations and wideband two-tier on-wafer measurements",
keywords = "16-term error model, calibration, calibration standards, millimeter waves, on-wafer measurement",
author = "K Dahlberg and K Silvonen and Tero Kiuru",
year = "2014",
doi = "10.1002/mop.28251",
language = "English",
volume = "56",
pages = "1036--1040",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "Wiley",
number = "5",

}

A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network. / Dahlberg, K (Corresponding Author); Silvonen, K; Kiuru, Tero.

In: Microwave and Optical Technology Letters, Vol. 56, No. 5, 2014, p. 1036-1040.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - A method for testing accuracy of the calibration standards based on reciprocity conditions of the error network

AU - Dahlberg, K

AU - Silvonen, K

AU - Kiuru, Tero

PY - 2014

Y1 - 2014

N2 - A method to define the accuracy of the known data of the calibration standards, presented in this article, is based on the reciprocity conditions of the error parameters. It can be seen that any error in calibration standards' definition leads to increasing apparent nonreciprocity in the error terms of passive test fixtures. It is an easy method to check the accuracy of the known data of the standards without any extra measurements or calculations. The method is demonstrated by simulations and wideband two-tier on-wafer measurements

AB - A method to define the accuracy of the known data of the calibration standards, presented in this article, is based on the reciprocity conditions of the error parameters. It can be seen that any error in calibration standards' definition leads to increasing apparent nonreciprocity in the error terms of passive test fixtures. It is an easy method to check the accuracy of the known data of the standards without any extra measurements or calculations. The method is demonstrated by simulations and wideband two-tier on-wafer measurements

KW - 16-term error model

KW - calibration

KW - calibration standards

KW - millimeter waves

KW - on-wafer measurement

U2 - 10.1002/mop.28251

DO - 10.1002/mop.28251

M3 - Article

VL - 56

SP - 1036

EP - 1040

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

SN - 0895-2477

IS - 5

ER -