A modified potential probe for induction charging risk assessment

Lars Fast, Jaakko Paasi

    Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

    1 Citation (Scopus)


    Practical assessment of risks for Electrostatic Discharge (ESD) failures of semiconductor devices, due to charges induced on devices in a manufacturing or repair environment of electronics has been difficult, because easily measurable parameters such as the electrostatic field and the potential of a charged surface do not directly quantify the risk. In this paper a new method of assessing the risks with induction charging of a sensitive device is presented by introducing a well-defined dummy device, which is a simple modification of the probe of DC type non-contacting electrostatic voltmeter. By placing the modified potential probe (mimicking large sensitive device) in front of charged surface, risks of ESD failure for a device due to induction charging can be assessed. The electrostatic response of the probe at different distances between charged surface and the probe has been verified by numerical model calculations. (6 refs.)
    Original languageEnglish
    Article number012035
    Number of pages4
    JournalJournal of Physics: Conference Series
    Issue number1
    Publication statusPublished - 2008
    MoE publication typeA4 Article in a conference publication
    EventElectrostatics 2007 - Oxford, United Kingdom
    Duration: 25 Mar 200729 Mar 2007


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