A modified potential probe for induction charging risk assessment

Lars Fast, Jaakko Paasi

    Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

    Abstract

    Practical assessment of risks for Electrostatic Discharge (ESD) failures of semiconductor devices, due to charges induced on devices in a manufacturing or repair environment of electronics has been difficult, because easily measurable parameters such as the electrostatic field and the potential of a charged surface do not directly quantify the risk. In this paper a new method of assessing the risks with induction charging of a sensitive device is presented by introducing a well-defined dummy device, which is a simple modification of the probe of DC type non-contacting electrostatic voltmeter. By placing the modified potential probe (mimicking large sensitive device) in front of charged surface, risks of ESD failure for a device due to induction charging can be assessed. The electrostatic response of the probe at different distances between charged surface and the probe has been verified by numerical model calculations. (6 refs.)
    Original languageEnglish
    Article number012035
    Number of pages4
    JournalJournal of Physics: Conference Series
    Volume142
    Issue number1
    DOIs
    Publication statusPublished - 2008
    MoE publication typeA4 Article in a conference publication
    EventElectrostatics 2007 - Oxford, United Kingdom
    Duration: 25 Mar 200729 Mar 2007

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    risk assessment
    charging
    induction
    probes
    electrostatics
    voltmeters
    dummies
    semiconductor devices
    manufacturing
    direct current
    electric fields
    electronics

    Cite this

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    title = "A modified potential probe for induction charging risk assessment",
    abstract = "Practical assessment of risks for Electrostatic Discharge (ESD) failures of semiconductor devices, due to charges induced on devices in a manufacturing or repair environment of electronics has been difficult, because easily measurable parameters such as the electrostatic field and the potential of a charged surface do not directly quantify the risk. In this paper a new method of assessing the risks with induction charging of a sensitive device is presented by introducing a well-defined dummy device, which is a simple modification of the probe of DC type non-contacting electrostatic voltmeter. By placing the modified potential probe (mimicking large sensitive device) in front of charged surface, risks of ESD failure for a device due to induction charging can be assessed. The electrostatic response of the probe at different distances between charged surface and the probe has been verified by numerical model calculations. (6 refs.)",
    author = "Lars Fast and Jaakko Paasi",
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    A modified potential probe for induction charging risk assessment. / Fast, Lars; Paasi, Jaakko.

    In: Journal of Physics: Conference Series, Vol. 142, No. 1, 012035, 2008.

    Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

    TY - JOUR

    T1 - A modified potential probe for induction charging risk assessment

    AU - Fast, Lars

    AU - Paasi, Jaakko

    PY - 2008

    Y1 - 2008

    N2 - Practical assessment of risks for Electrostatic Discharge (ESD) failures of semiconductor devices, due to charges induced on devices in a manufacturing or repair environment of electronics has been difficult, because easily measurable parameters such as the electrostatic field and the potential of a charged surface do not directly quantify the risk. In this paper a new method of assessing the risks with induction charging of a sensitive device is presented by introducing a well-defined dummy device, which is a simple modification of the probe of DC type non-contacting electrostatic voltmeter. By placing the modified potential probe (mimicking large sensitive device) in front of charged surface, risks of ESD failure for a device due to induction charging can be assessed. The electrostatic response of the probe at different distances between charged surface and the probe has been verified by numerical model calculations. (6 refs.)

    AB - Practical assessment of risks for Electrostatic Discharge (ESD) failures of semiconductor devices, due to charges induced on devices in a manufacturing or repair environment of electronics has been difficult, because easily measurable parameters such as the electrostatic field and the potential of a charged surface do not directly quantify the risk. In this paper a new method of assessing the risks with induction charging of a sensitive device is presented by introducing a well-defined dummy device, which is a simple modification of the probe of DC type non-contacting electrostatic voltmeter. By placing the modified potential probe (mimicking large sensitive device) in front of charged surface, risks of ESD failure for a device due to induction charging can be assessed. The electrostatic response of the probe at different distances between charged surface and the probe has been verified by numerical model calculations. (6 refs.)

    U2 - 10.1088/1742-6596/142/1/012035

    DO - 10.1088/1742-6596/142/1/012035

    M3 - Article in a proceedings journal

    VL - 142

    JO - Journal of Physics: Conference Series

    JF - Journal of Physics: Conference Series

    SN - 1742-6588

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    M1 - 012035

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