A novel method for millimeter-wave on-wafer characterization of reflect patch antennas

Paola Farinelli; Tauno Vähä-Heikkilä; Jussi Säily; Roberto Sorrentino; Jussi Tuovinen

doi:10.1109/LAWP.2006.889554

A novel method for millimeter-wave on-wafer characterization of reflect patch antennas

Paola Farinelli, Tauno Vähä-Heikkilä, Jussi Säily, Roberto Sorrentino, Jussi Tuovinen

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

Abstract

This letter presents a simple new measurement procedure to test single elements of electrically steerable reflectarray antennas. The method allows one to measure the reflection coefficient of reflector antenna elementary cells consisting of resonating elements and phase or amplitude control circuits (MMIC, RF-MEMS, ferroelectric, etc.). The measurement system can be used for verifying the correct functionalities and steering capabilities of antenna arrays without the need of expensive and time consuming full antenna measurements. The method has been verified at V-band on a LTCC patch antenna at V-band (57.2 GHz). The measurement results are presented in comparison with the theory, showing very good agreement.

Original language	English
Pages (from-to)	556-558
Number of pages	3
Journal	IEEE Antennas and Wireless Propagation Letters
Volume	5
Issue number	1
DOIs	https://doi.org/10.1109/LAWP.2006.889554
Publication status	Published - 2006
MoE publication type	A1 Journal article-refereed

Keywords

On-wafer
phase shifter
phased array
reflect-array

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10.1109/LAWP.2006.889554

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title = "A novel method for millimeter-wave on-wafer characterization of reflect patch antennas",

abstract = "This letter presents a simple new measurement procedure to test single elements of electrically steerable reflectarray antennas. The method allows one to measure the reflection coefficient of reflector antenna elementary cells consisting of resonating elements and phase or amplitude control circuits (MMIC, RF-MEMS, ferroelectric, etc.). The measurement system can be used for verifying the correct functionalities and steering capabilities of antenna arrays without the need of expensive and time consuming full antenna measurements. The method has been verified at V-band on a LTCC patch antenna at V-band (57.2 GHz). The measurement results are presented in comparison with the theory, showing very good agreement.",

keywords = "On-wafer, phase shifter, phased array, reflect-array",

author = "Paola Farinelli and Tauno V{\"a}h{\"a}-Heikkil{\"a} and Jussi S{\"a}ily and Roberto Sorrentino and Jussi Tuovinen",

year = "2006",

doi = "10.1109/LAWP.2006.889554",

language = "English",

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T1 - A novel method for millimeter-wave on-wafer characterization of reflect patch antennas

AU - Farinelli, Paola

AU - Vähä-Heikkilä, Tauno

AU - Säily, Jussi

AU - Sorrentino, Roberto

AU - Tuovinen, Jussi

PY - 2006

Y1 - 2006

N2 - This letter presents a simple new measurement procedure to test single elements of electrically steerable reflectarray antennas. The method allows one to measure the reflection coefficient of reflector antenna elementary cells consisting of resonating elements and phase or amplitude control circuits (MMIC, RF-MEMS, ferroelectric, etc.). The measurement system can be used for verifying the correct functionalities and steering capabilities of antenna arrays without the need of expensive and time consuming full antenna measurements. The method has been verified at V-band on a LTCC patch antenna at V-band (57.2 GHz). The measurement results are presented in comparison with the theory, showing very good agreement.

AB - This letter presents a simple new measurement procedure to test single elements of electrically steerable reflectarray antennas. The method allows one to measure the reflection coefficient of reflector antenna elementary cells consisting of resonating elements and phase or amplitude control circuits (MMIC, RF-MEMS, ferroelectric, etc.). The measurement system can be used for verifying the correct functionalities and steering capabilities of antenna arrays without the need of expensive and time consuming full antenna measurements. The method has been verified at V-band on a LTCC patch antenna at V-band (57.2 GHz). The measurement results are presented in comparison with the theory, showing very good agreement.

KW - On-wafer

KW - phase shifter

KW - phased array

KW - reflect-array

U2 - 10.1109/LAWP.2006.889554

DO - 10.1109/LAWP.2006.889554

M3 - Article

SN - 1536-1225

VL - 5

SP - 556

EP - 558

JO - IEEE Antennas and Wireless Propagation Letters

JF - IEEE Antennas and Wireless Propagation Letters

IS - 1

ER -

A novel method for millimeter-wave on-wafer characterization of reflect patch antennas

Abstract

Keywords

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