Abstract
We present a new technique for orienting polymer semiconductor thin
films. In our technique, polymer chains are rigorously oriented without
using any mechanical tools and with minimal risk of film contamination.
The technique is based on the mechanical force resulting from the
in‐plane shrinkage exerted by a shrinker (top layer) that is used to
orient the semiconductor beneath an intermediate layer; the latter
acting as a force mediator. The chain orientation is demonstrated by
several techniques such as crossed‐polarizer microscopy, atomic force
microscopy, grazing‐incidence X‐ray diffraction, and polarized
absorption. The orientation geometry is controlled by the shrinking
process and the shrinker area. The semiconductivity of the film only
stems from the transistor device structures under study, and the method
can therefore be generalized.
Original language | English |
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Pages (from-to) | 1095-1099 |
Number of pages | 5 |
Journal | Advanced Functional Materials |
Volume | 15 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2005 |
MoE publication type | A1 Journal article-refereed |
Keywords
- alignment
- polymers
- semiconductor