A novel method to orient semiconducting polymer films

Tomas G Bäcklund, Henrik Sandberg, Ronald Österbacka (Corresponding Author), Henrik Stubb, Mika Torkkeli, Ritva Serimaa

Research output: Contribution to journalArticleScientificpeer-review

18 Citations (Scopus)

Abstract

We present a new technique for orienting polymer semiconductor thin films. In our technique, polymer chains are rigorously oriented without using any mechanical tools and with minimal risk of film contamination. The technique is based on the mechanical force resulting from the in‐plane shrinkage exerted by a shrinker (top layer) that is used to orient the semiconductor beneath an intermediate layer; the latter acting as a force mediator. The chain orientation is demonstrated by several techniques such as crossed‐polarizer microscopy, atomic force microscopy, grazing‐incidence X‐ray diffraction, and polarized absorption. The orientation geometry is controlled by the shrinking process and the shrinker area. The semiconductivity of the film only stems from the transistor device structures under study, and the method can therefore be generalized.
Original languageEnglish
Pages (from-to)1095-1099
Number of pages5
JournalAdvanced Functional Materials
Volume15
Issue number7
DOIs
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

Fingerprint

Semiconducting films
Semiconducting polymers
Polymer films
Polymers
Semiconductor materials
polymers
stems
shrinkage
Atomic force microscopy
Microscopic examination
Transistors
contamination
Contamination
transistors
Diffraction
atomic force microscopy
microscopy
Thin films
Geometry
thin films

Keywords

  • alignment
  • polymers
  • semiconductor

Cite this

Bäcklund, T. G., Sandberg, H., Österbacka, R., Stubb, H., Torkkeli, M., & Serimaa, R. (2005). A novel method to orient semiconducting polymer films. Advanced Functional Materials, 15(7), 1095-1099. https://doi.org/10.1002/adfm.200400448
Bäcklund, Tomas G ; Sandberg, Henrik ; Österbacka, Ronald ; Stubb, Henrik ; Torkkeli, Mika ; Serimaa, Ritva. / A novel method to orient semiconducting polymer films. In: Advanced Functional Materials. 2005 ; Vol. 15, No. 7. pp. 1095-1099.
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Bäcklund, TG, Sandberg, H, Österbacka, R, Stubb, H, Torkkeli, M & Serimaa, R 2005, 'A novel method to orient semiconducting polymer films', Advanced Functional Materials, vol. 15, no. 7, pp. 1095-1099. https://doi.org/10.1002/adfm.200400448

A novel method to orient semiconducting polymer films. / Bäcklund, Tomas G; Sandberg, Henrik; Österbacka, Ronald (Corresponding Author); Stubb, Henrik; Torkkeli, Mika; Serimaa, Ritva.

In: Advanced Functional Materials, Vol. 15, No. 7, 2005, p. 1095-1099.

Research output: Contribution to journalArticleScientificpeer-review

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T1 - A novel method to orient semiconducting polymer films

AU - Bäcklund, Tomas G

AU - Sandberg, Henrik

AU - Österbacka, Ronald

AU - Stubb, Henrik

AU - Torkkeli, Mika

AU - Serimaa, Ritva

PY - 2005

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N2 - We present a new technique for orienting polymer semiconductor thin films. In our technique, polymer chains are rigorously oriented without using any mechanical tools and with minimal risk of film contamination. The technique is based on the mechanical force resulting from the in‐plane shrinkage exerted by a shrinker (top layer) that is used to orient the semiconductor beneath an intermediate layer; the latter acting as a force mediator. The chain orientation is demonstrated by several techniques such as crossed‐polarizer microscopy, atomic force microscopy, grazing‐incidence X‐ray diffraction, and polarized absorption. The orientation geometry is controlled by the shrinking process and the shrinker area. The semiconductivity of the film only stems from the transistor device structures under study, and the method can therefore be generalized.

AB - We present a new technique for orienting polymer semiconductor thin films. In our technique, polymer chains are rigorously oriented without using any mechanical tools and with minimal risk of film contamination. The technique is based on the mechanical force resulting from the in‐plane shrinkage exerted by a shrinker (top layer) that is used to orient the semiconductor beneath an intermediate layer; the latter acting as a force mediator. The chain orientation is demonstrated by several techniques such as crossed‐polarizer microscopy, atomic force microscopy, grazing‐incidence X‐ray diffraction, and polarized absorption. The orientation geometry is controlled by the shrinking process and the shrinker area. The semiconductivity of the film only stems from the transistor device structures under study, and the method can therefore be generalized.

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KW - polymers

KW - semiconductor

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