Keyphrases
Secondary Ion Mass Spectrometry
100%
AuPt
100%
Phosphorylated tau
100%
Ion Beam Mixing
100%
Thermal Spike
100%
Low-energy Ion Beam
100%
Monte Carlo Simulation
50%
Decay Length
50%
Depth Resolution
50%
Solid State
50%
Electron-phonon Coupling
50%
Si Substrate
50%
Ar Ions
50%
Trailing Edge
50%
Adjustable Parameters
50%
Atomic Mixing
50%
Thermal Spike Model
50%
Rapid Quenching
50%
Metallic Interface
50%
INIS
interfaces
100%
energy
100%
ions
100%
ion beams
100%
mass spectrometry
100%
mixing
100%
thermal spikes
60%
simulation
20%
decay
20%
layers
20%
comparative evaluations
20%
information
20%
substrates
20%
coupling
20%
monte carlo method
20%
length
20%
gain
20%
depth
20%
kev range
20%
resolution
20%
quenching
20%
argon ions
20%
Engineering
Broadening
100%
Ion Beam Mixing
100%
Si Substrate
50%
Information Gain
50%
Rapid Quenching
50%
Trailing Edge
50%
Physics
Ion Beam
100%
Secondary Ion Mass Spectrometry
100%
Monte Carlo Method
100%