There is a growing industry fabricating products that are based on nanoparticles (particle diameter dp≤100 nm). The production of these particles requires detection, classification and characterisation of even smaller particles because of, e.g. preventing unwanted particle emissions from the processes and health issues. Monitoring of the processes is needed on one hand for product quality determinations, on the other hand to ensure safe and particle-free working conditions. Thus simple, fast and reliable measurement devices are needed for particle characterisation.
|Journal||Journal of Physics: Conference Series|
|Publication status||Published - 2009|
|MoE publication type||A4 Article in a conference publication|
|Event||International Conference on Safe Production and Use of Nanomaterials, Nanosafe2008 - Grenoble, France|
Duration: 3 Nov 2008 → 7 Nov 2008