A spectrometer and a method for controlling the spectrometer

The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source (140) formed by multiple single radiation sources (141) having different central wavelengths, for generating a measuring signal, a measurement object (100) containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter (120, 220) for the band pass filtering the measuring signal by at least two pass bands, and a detector (300, 400) for detecting said filtered measuring signals received from the measurement object (100). In accordance with the invention the spectrometer has means (312) for modulating each of the single radiation sources (141) and correspondingly means (307, 309) for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (300, 400), and the spectrometer has means for detecting (300, 400) and demodulating (306, 307) multiple pass bands simultaneously.

Patent family as of 2.9.2021
EP2106537 A1 20091007 EP20080701723 20080123      
EP2106537 A4 20131204 EP20080701723 20080123      
EP2106537 B1 20201118 EP20080701723 20080123      
GB200701536 A0 20070307 GB20070001536 20070126      
GB2445956 A1 20080730 GB20070001536 20070126      
GB2445956 B2 20091202 GB20070001536 20070126      
US2010097613 AA 20100422 US20080524335 20080123      
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WO08090261 A1 20080731 WO2008FI50023 20080123

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