A study on design for testability in component-based embedded software

Teemu Kanstren

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

7 Citations (Scopus)

Abstract

Effective implementation of test automation requires taking testing into account in the system design. In short, this is called design for testability (DFT). In this paper a study on DFT in component-based embedded software is presented, based on the interviews and technical documentation from two large-scale companies in the European telecom industry.
The way test automation is addressed and the different techniques applied to make this more effective at the architectural level are described. The differences and benefits of different approaches are discussed
Original languageEnglish
Title of host publicationProceedings
Subtitle of host publication6th International Conference on Software Engineering Research, Management and Applications, SERA 2008
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages31-38
ISBN (Print)978-0-7695-3302-5
DOIs
Publication statusPublished - 2008
MoE publication typeA4 Article in a conference publication
Event6th International Conference on Software Engineering Research, Management and Applications, SERA 2008 - Prague, Czech Republic
Duration: 20 Aug 200822 Aug 2008

Conference

Conference6th International Conference on Software Engineering Research, Management and Applications, SERA 2008
Abbreviated titleSERA 2008
CountryCzech Republic
CityPrague
Period20/08/0822/08/08

Fingerprint Dive into the research topics of 'A study on design for testability in component-based embedded software'. Together they form a unique fingerprint.

  • Cite this

    Kanstren, T. (2008). A study on design for testability in component-based embedded software. In Proceedings : 6th International Conference on Software Engineering Research, Management and Applications, SERA 2008 (pp. 31-38). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/SERA.2008.11