Abstract
A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.
Original language | English |
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Pages (from-to) | 1489-1495 |
Number of pages | 7 |
Journal | IEEE Transactions on Microwave Theory and Techniques |
Volume | 51 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2003 |
MoE publication type | A1 Journal article-refereed |
Keywords
- noise-parameter measurements
- on-wafer characterization
- wide-band measurements