A wide-band on-wafer noise parameter measurement system at 50-75 GHz

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    Abstract

    A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.
    Original languageEnglish
    Pages (from-to)1489-1495
    Number of pages7
    JournalIEEE Transactions on Microwave Theory and Techniques
    Volume51
    Issue number5
    DOIs
    Publication statusPublished - 2003
    MoE publication typeA1 Journal article-refereed

    Keywords

    • noise-parameter measurements
    • on-wafer characterization
    • wide-band measurements

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