A wide-band on-wafer noise parameter measurement system at 50-75 GHz

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Abstract

A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.
Original languageEnglish
Pages (from-to)1489-1495
Number of pages7
JournalIEEE Transactions on Microwave Theory and Techniques
Volume51
Issue number5
DOIs
Publication statusPublished - 2003
MoE publication typeA1 Journal article-refereed

Keywords

  • noise-parameter measurements
  • on-wafer characterization
  • wide-band measurements

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