A wide-band on-wafer noise parameter measurement system at 50-75 GHz

Mikko Kantanen; Manu Lahdes; Tauno Vähä-Heikkilä; Jussi Tuovinen

doi:10.1109/TMTT.2003.810129

A wide-band on-wafer noise parameter measurement system at 50-75 GHz

Mikko Kantanen, Manu Lahdes, Tauno Vähä-Heikkilä, Jussi Tuovinen

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34 Citations (Scopus)

Abstract

A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.

Original language	English
Pages (from-to)	1489-1495
Number of pages	7
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	51
Issue number	5
DOIs	https://doi.org/10.1109/TMTT.2003.810129
Publication status	Published - 2003
MoE publication type	A1 Journal article-refereed

Keywords

noise-parameter measurements
on-wafer characterization
wide-band measurements

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10.1109/TMTT.2003.810129

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title = "A wide-band on-wafer noise parameter measurement system at 50-75 GHz",

abstract = "A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.",

keywords = "noise-parameter measurements, on-wafer characterization, wide-band measurements",

author = "Mikko Kantanen and Manu Lahdes and Tauno V{\"a}h{\"a}-Heikkil{\"a} and Jussi Tuovinen",

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T1 - A wide-band on-wafer noise parameter measurement system at 50-75 GHz

AU - Kantanen, Mikko

AU - Lahdes, Manu

AU - Vähä-Heikkilä, Tauno

AU - Tuovinen, Jussi

PY - 2003

Y1 - 2003

N2 - A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.

AB - A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.

KW - noise-parameter measurements

KW - on-wafer characterization

KW - wide-band measurements

U2 - 10.1109/TMTT.2003.810129

DO - 10.1109/TMTT.2003.810129

M3 - Article

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SP - 1489

EP - 1495

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 5

ER -

A wide-band on-wafer noise parameter measurement system at 50-75 GHz

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Keywords

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