A wide-band on-wafer noise parameter measurement system at 50-75 GHz

    Research output: Contribution to journalArticleScientificpeer-review

    31 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'A wide-band on-wafer noise parameter measurement system at 50-75 GHz'. Together they form a unique fingerprint.

    Physics & Astronomy

    Engineering & Materials Science