A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz

Mikko Kantanen, Manu Lahdes, Jussi Tuovinen, Tauno Vähä-Heikkilä, P. Kangaslahti, P. Jukkala, N. Hughes

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

A wideband automated on-wafer noise parameter measurement system has been built. Using measurement system developed here, noise parameters of a chip device can be determined over entire 50-75 GHz range in an automated manner. As an example, measured noise parameters of an InP HEMT are shown over 50-75 GHz.
Original languageEnglish
Title of host publicationThe 9th European Gallium Arsenide and Other Semiconductors Application Symposium GAAS 2001
Subtitle of host publicationLondon, UK, 24-25 September 2001
PublisherCMP Europe Ltd
Pages255-258
Publication statusPublished - 2001
MoE publication typeNot Eligible

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    Kantanen, M., Lahdes, M., Tuovinen, J., Vähä-Heikkilä, T., Kangaslahti, P., Jukkala, P., & Hughes, N. (2001). A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz. In The 9th European Gallium Arsenide and Other Semiconductors Application Symposium GAAS 2001: London, UK, 24-25 September 2001 (pp. 255-258). CMP Europe Ltd.