A wideband automated on-wafer noise parameter measurement system has been built. Using measurement system developed here, noise parameters of a chip device can be determined over entire 50-75 GHz range in an automated manner. As an example, measured noise parameters of an InP HEMT are shown over 50-75 GHz.
|Title of host publication||The 9th European Gallium Arsenide and Other Semiconductors Application Symposium GAAS 2001|
|Subtitle of host publication||London, UK, 24-25 September 2001|
|Publisher||CMP Europe Ltd|
|Publication status||Published - 2001|
|MoE publication type||Not Eligible|