A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz

Mikko Kantanen; Manu Lahdes; Jussi Tuovinen; Tauno Vähä-Heikkilä; P. Kangaslahti; P. Jukkala; N. Hughes

A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz

Mikko Kantanen
, Manu Lahdes
, Jussi Tuovinen
, Tauno Vähä-Heikkilä
, P. Kangaslahti
, P. Jukkala
, N. Hughes

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

A wideband automated on-wafer noise parameter measurement system has been built. Using measurement system developed here, noise parameters of a chip device can be determined over entire 50-75 GHz range in an automated manner. As an example, measured noise parameters of an InP HEMT are shown over 50-75 GHz.

Original language	English
Title of host publication	The 9th European Gallium Arsenide and Other Semiconductors Application Symposium GAAS 2001
Subtitle of host publication	London, UK, 24-25 September 2001
Publisher	CMP Europe Ltd
Pages	255-258
Publication status	Published - 2001
MoE publication type	Not Eligible

Cite this

@inproceedings{4a8656c0cac441b19fdb11c71e76bd65,

title = "A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz",

abstract = "A wideband automated on-wafer noise parameter measurement system has been built. Using measurement system developed here, noise parameters of a chip device can be determined over entire 50-75 GHz range in an automated manner. As an example, measured noise parameters of an InP HEMT are shown over 50-75 GHz.",

author = "Mikko Kantanen and Manu Lahdes and Jussi Tuovinen and Tauno V{\"a}h{\"a}-Heikkil{\"a} and P. Kangaslahti and P. Jukkala and N. Hughes",

note = "Pre-printed review. Held as part of the 31st European microwave conference. No ISBN/ISSN found for the proceedings. ",

year = "2001",

language = "English",

pages = "255--258",

booktitle = "The 9th European Gallium Arsenide and Other Semiconductors Application Symposium GAAS 2001",

publisher = "CMP Europe Ltd",

address = "United Kingdom",

}

A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz. / Kantanen, Mikko ; Lahdes, Manu; Tuovinen, Jussi et al.
The 9th European Gallium Arsenide and Other Semiconductors Application Symposium GAAS 2001: London, UK, 24-25 September 2001. CMP Europe Ltd, 2001. p. 255-258.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz

AU - Kantanen, Mikko

AU - Lahdes, Manu

AU - Tuovinen, Jussi

AU - Vähä-Heikkilä, Tauno

AU - Kangaslahti, P.

AU - Jukkala, P.

AU - Hughes, N.

N1 - Pre-printed review. Held as part of the 31st European microwave conference. No ISBN/ISSN found for the proceedings.

PY - 2001

Y1 - 2001

N2 - A wideband automated on-wafer noise parameter measurement system has been built. Using measurement system developed here, noise parameters of a chip device can be determined over entire 50-75 GHz range in an automated manner. As an example, measured noise parameters of an InP HEMT are shown over 50-75 GHz.

AB - A wideband automated on-wafer noise parameter measurement system has been built. Using measurement system developed here, noise parameters of a chip device can be determined over entire 50-75 GHz range in an automated manner. As an example, measured noise parameters of an InP HEMT are shown over 50-75 GHz.

M3 - Conference article in proceedings

SP - 255

EP - 258

BT - The 9th European Gallium Arsenide and Other Semiconductors Application Symposium GAAS 2001

PB - CMP Europe Ltd

ER -

A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz

Abstract

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Cite this