A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz
- Mikko Kantanen
- , Manu Lahdes
- , Jussi Tuovinen
- , Tauno Vähä-Heikkilä
- , P. Kangaslahti
- , P. Jukkala
- , N. Hughes
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review