A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz

Mikko Kantanen, Manu Lahdes, Jussi Tuovinen, Tauno Vähä-Heikkilä, P. Kangaslahti, P. Jukkala, N. Hughes

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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