Accuracy considerations of cryogenic noise temperature measurements at V-band

Anna Karvonen, Jussi Varis, Hannu Hakojärvi, Jussi Tuovinen

    Research output: Contribution to conferenceConference articleScientific

    Abstract

    The noise figures of four InP HEMT LNAs at cryogenic temperature of 20 k were measured in millilab at v-band using noise diode as a noise source. Noise figures and uncertainties were calculated considering all the major mismatch coefficients.
    Original languageEnglish
    Pages180-183
    Publication statusPublished - 2004
    MoE publication typeNot Eligible
    EventInternational Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004. - Yokosuka, Japan
    Duration: 26 Feb 200427 Feb 2004

    Conference

    ConferenceInternational Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004.
    CountryJapan
    CityYokosuka
    Period26/02/0427/02/04

    Keywords

    • noise temperature
    • cryogenic
    • accuracy
    • uncertainty
    • V-band
    • measurements

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  • Cite this

    Karvonen, A., Varis, J., Hakojärvi, H., & Tuovinen, J. (2004). Accuracy considerations of cryogenic noise temperature measurements at V-band. 180-183. Paper presented at International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004., Yokosuka, Japan.