Accuracy considerations of cryogenic noise temperature measurements at V-band

Anna Karvonen; Jussi Varis; Hannu Hakojärvi; Jussi Tuovinen

Accuracy considerations of cryogenic noise temperature measurements at V-band

Anna Karvonen, Jussi Varis, Hannu Hakojärvi, Jussi Tuovinen

Research output: Contribution to conference › Conference article › Scientific

Abstract

The noise figures of four InP HEMT LNAs at cryogenic temperature of 20 k were measured in millilab at v-band using noise diode as a noise source. Noise figures and uncertainties were calculated considering all the major mismatch coefficients.

Original language	English
Pages	180-183
Publication status	Published - 2004
MoE publication type	Not Eligible
Event	International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004. - Yokosuka, Japan Duration: 26 Feb 2004 → 27 Feb 2004

Conference

Conference	International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004.
Country/Territory	Japan
City	Yokosuka
Period	26/02/04 → 27/02/04

Keywords

noise temperature
cryogenic
accuracy
uncertainty
V-band
measurements

Cite this

@conference{4853ab48ee444a6a84055acd0ce221fa,

title = "Accuracy considerations of cryogenic noise temperature measurements at V-band",

abstract = "The noise figures of four InP HEMT LNAs at cryogenic temperature of 20 k were measured in millilab at v-band using noise diode as a noise source. Noise figures and uncertainties were calculated considering all the major mismatch coefficients.",

keywords = "noise temperature, cryogenic, accuracy, uncertainty, V-band, measurements",

author = "Anna Karvonen and Jussi Varis and Hannu Hakoj{\"a}rvi and Jussi Tuovinen",

note = "Project code: T3SU00070; International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004. ; Conference date: 26-02-2004 Through 27-02-2004",

year = "2004",

language = "English",

pages = "180--183",

}

Karvonen, A, Varis, J, Hakojärvi, H & Tuovinen, J 2004, 'Accuracy considerations of cryogenic noise temperature measurements at V-band', Paper presented at International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004., Yokosuka, Japan, 26/02/04 - 27/02/04 pp. 180-183.

Accuracy considerations of cryogenic noise temperature measurements at V-band. / Karvonen, Anna; Varis, Jussi; Hakojärvi, Hannu et al.
2004. 180-183 Paper presented at International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004., Yokosuka, Japan.

Research output: Contribution to conference › Conference article › Scientific

TY - CONF

T1 - Accuracy considerations of cryogenic noise temperature measurements at V-band

AU - Karvonen, Anna

AU - Varis, Jussi

AU - Hakojärvi, Hannu

AU - Tuovinen, Jussi

N1 - Project code: T3SU00070

PY - 2004

Y1 - 2004

N2 - The noise figures of four InP HEMT LNAs at cryogenic temperature of 20 k were measured in millilab at v-band using noise diode as a noise source. Noise figures and uncertainties were calculated considering all the major mismatch coefficients.

AB - The noise figures of four InP HEMT LNAs at cryogenic temperature of 20 k were measured in millilab at v-band using noise diode as a noise source. Noise figures and uncertainties were calculated considering all the major mismatch coefficients.

KW - noise temperature

KW - cryogenic

KW - accuracy

KW - uncertainty

KW - V-band

KW - measurements

M3 - Conference article

SP - 180

EP - 183

T2 - International Joint Conference of the 6th Topical Symposium on Millimeter Waves, TSMMW 2004 and the 5th MINT Millimeter-Wave International Symposium, MINT-MIS 2004.

Y2 - 26 February 2004 through 27 February 2004

ER -

Accuracy considerations of cryogenic noise temperature measurements at V-band

Abstract

Conference

Keywords

Fingerprint

Cite this