Adaptive Sub-Threshold Test Circuit

Matthew, J. Turnquist, Erkka Laulainen, Jani Mäkipää, Hannu Tenhunen, Lauri Koskinen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)

Abstract

Emerging ubiquitous systems such as distributed sensor networks require ultra-low power consumption. The energy minimum and thus, the lowest possible power consumption of CMOS logic, is achieved in the sub-threshold region.
The exponential dependence of the drain current on threshold voltage variations leads to increased overdesign if sub-threshold circuits are to be robust. Adaptive systems are required to address variability robustness. One approach to achieve adaptivity is timing error detection (TED) within the circuit. Presented here is a TED latch capable of sub-threshold operation. It was designed in 65 nm technology, has an operating voltage range of 0.25 V through 1.2 V, and a minimum energy point (MEP) of 0.4 V. At the MEP, the average power consumption for one clock period and an activity factor of alpha=0.5 is 0.43 nW. The area of the TED latch is 101-um2.
A sub-threshold CORDIC implementation is presented to demonstrate the TED latch at a system level.
Original languageEnglish
Title of host publicationProceedings
Subtitle of host publicationNASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages197-203
ISBN (Print)978-0-7695-3714-6
DOIs
Publication statusPublished - 2009
MoE publication typeA4 Article in a conference publication
EventNASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009 - San Francisco, CA, United States
Duration: 29 Jul 20091 Aug 2009

Conference

ConferenceNASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009
Abbreviated titleAHS 2009
CountryUnited States
CitySan Francisco, CA
Period29/07/091/08/09

Fingerprint

Error detection
Electric power utilization
Networks (circuits)
Flip flop circuits
Drain current
Adaptive systems
Robustness (control systems)
Threshold voltage
Sensor networks
Clocks
Electric potential

Cite this

Turnquist, M. J., Laulainen, E., Mäkipää, J., Tenhunen, H., & Koskinen, L. (2009). Adaptive Sub-Threshold Test Circuit. In Proceedings : NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009 (pp. 197-203). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/AHS.2009.20
Turnquist, Matthew, J. ; Laulainen, Erkka ; Mäkipää, Jani ; Tenhunen, Hannu ; Koskinen, Lauri. / Adaptive Sub-Threshold Test Circuit. Proceedings : NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009. IEEE Institute of Electrical and Electronic Engineers , 2009. pp. 197-203
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Turnquist, MJ, Laulainen, E, Mäkipää, J, Tenhunen, H & Koskinen, L 2009, Adaptive Sub-Threshold Test Circuit. in Proceedings : NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009. IEEE Institute of Electrical and Electronic Engineers , pp. 197-203, NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009, San Francisco, CA, United States, 29/07/09. https://doi.org/10.1109/AHS.2009.20

Adaptive Sub-Threshold Test Circuit. / Turnquist, Matthew, J.; Laulainen, Erkka; Mäkipää, Jani; Tenhunen, Hannu; Koskinen, Lauri.

Proceedings : NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009. IEEE Institute of Electrical and Electronic Engineers , 2009. p. 197-203.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

TY - GEN

T1 - Adaptive Sub-Threshold Test Circuit

AU - Turnquist, Matthew, J.

AU - Laulainen, Erkka

AU - Mäkipää, Jani

AU - Tenhunen, Hannu

AU - Koskinen, Lauri

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N2 - Emerging ubiquitous systems such as distributed sensor networks require ultra-low power consumption. The energy minimum and thus, the lowest possible power consumption of CMOS logic, is achieved in the sub-threshold region. The exponential dependence of the drain current on threshold voltage variations leads to increased overdesign if sub-threshold circuits are to be robust. Adaptive systems are required to address variability robustness. One approach to achieve adaptivity is timing error detection (TED) within the circuit. Presented here is a TED latch capable of sub-threshold operation. It was designed in 65 nm technology, has an operating voltage range of 0.25 V through 1.2 V, and a minimum energy point (MEP) of 0.4 V. At the MEP, the average power consumption for one clock period and an activity factor of alpha=0.5 is 0.43 nW. The area of the TED latch is 101-um2. A sub-threshold CORDIC implementation is presented to demonstrate the TED latch at a system level.

AB - Emerging ubiquitous systems such as distributed sensor networks require ultra-low power consumption. The energy minimum and thus, the lowest possible power consumption of CMOS logic, is achieved in the sub-threshold region. The exponential dependence of the drain current on threshold voltage variations leads to increased overdesign if sub-threshold circuits are to be robust. Adaptive systems are required to address variability robustness. One approach to achieve adaptivity is timing error detection (TED) within the circuit. Presented here is a TED latch capable of sub-threshold operation. It was designed in 65 nm technology, has an operating voltage range of 0.25 V through 1.2 V, and a minimum energy point (MEP) of 0.4 V. At the MEP, the average power consumption for one clock period and an activity factor of alpha=0.5 is 0.43 nW. The area of the TED latch is 101-um2. A sub-threshold CORDIC implementation is presented to demonstrate the TED latch at a system level.

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Turnquist MJ, Laulainen E, Mäkipää J, Tenhunen H, Koskinen L. Adaptive Sub-Threshold Test Circuit. In Proceedings : NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2009. IEEE Institute of Electrical and Electronic Engineers . 2009. p. 197-203 https://doi.org/10.1109/AHS.2009.20