Advanced flaw manufacturing and crack growth control

M. Kemppainen, Jorma Pitkänen, I. Virkkunen, Hannu Hänninen

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

Abstract

Advanced artificial flaw manufacturing method has become available. The method produces true fatigue cracks, which are representative of most service‐induced cracks. These cracks can be used to simulate behaviour of realistic cracks under service conditions. This paper introduces studies of the effects of different thermal loading cycles to crack opening and residual stress state as seen at the surface of the sample and in the ultrasonic signal. In‐situ measurements were performed under dynamic thermal fatigue loading of a 20 mm long artificial crack.
Original languageEnglish
Title of host publicationQuantitative Nondestructive Evaluation
Place of PublicationMelville, New York
PublisherAmerican Institute of Physics AIP
Pages1272-1279
ISBN (Print)0-7354-0173-X
DOIs
Publication statusPublished - 2004
MoE publication typeNot Eligible
EventReview of Progress in Quantitative Nondestructive Evaluation Conference, QNDE - Green Bay, United States
Duration: 27 Jul 20031 Aug 2003

Publication series

NameAIP Conference Proceedings
PublisherAIP
Volume700
ISSN (Print)1224-1231

Conference

ConferenceReview of Progress in Quantitative Nondestructive Evaluation Conference, QNDE
CountryUnited States
CityGreen Bay
Period27/07/031/08/03

Fingerprint

Crack propagation
Cracks
Defects
Thermal fatigue
Residual stresses
Ultrasonics

Cite this

Kemppainen, M., Pitkänen, J., Virkkunen, I., & Hänninen, H. (2004). Advanced flaw manufacturing and crack growth control. In Quantitative Nondestructive Evaluation (pp. 1272-1279). Melville, New York: American Institute of Physics AIP. AIP Conference Proceedings, Vol.. 700 https://doi.org/10.1063/1.1711763
Kemppainen, M. ; Pitkänen, Jorma ; Virkkunen, I. ; Hänninen, Hannu. / Advanced flaw manufacturing and crack growth control. Quantitative Nondestructive Evaluation. Melville, New York : American Institute of Physics AIP, 2004. pp. 1272-1279 (AIP Conference Proceedings, Vol. 700).
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Kemppainen, M, Pitkänen, J, Virkkunen, I & Hänninen, H 2004, Advanced flaw manufacturing and crack growth control. in Quantitative Nondestructive Evaluation. American Institute of Physics AIP, Melville, New York, AIP Conference Proceedings, vol. 700, pp. 1272-1279, Review of Progress in Quantitative Nondestructive Evaluation Conference, QNDE, Green Bay, United States, 27/07/03. https://doi.org/10.1063/1.1711763

Advanced flaw manufacturing and crack growth control. / Kemppainen, M.; Pitkänen, Jorma; Virkkunen, I.; Hänninen, Hannu.

Quantitative Nondestructive Evaluation. Melville, New York : American Institute of Physics AIP, 2004. p. 1272-1279 (AIP Conference Proceedings, Vol. 700).

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

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Kemppainen M, Pitkänen J, Virkkunen I, Hänninen H. Advanced flaw manufacturing and crack growth control. In Quantitative Nondestructive Evaluation. Melville, New York: American Institute of Physics AIP. 2004. p. 1272-1279. (AIP Conference Proceedings, Vol. 700). https://doi.org/10.1063/1.1711763