Abstract
Possibility to control the adhesion properties is
important in various industrial applications. Since the
topmost surface layers have the greatest role in adhesion
thus making surface-controlled atomic layer deposition
(ALD) reactions appealing method for tailoring surface
adhesion properties.
In this presentation we show that ALD and
molecular-layer-deposition (MLD) can be used to adjust
wetting characteristics of polymers and metals. Recently
we have been modifying surface properties for various
applications including ink-jet printed films, adhesion
promoting layers for extrusion coatings and anti-ice
coatings. In addition to conventional inorganic metal
oxides, such as Al2O3, we have tested also
inorganic-organic hybrid MLD materials. Various tools,
such as XPS, FT-IR and TOF-ERDA, were used to
characterize these films, and wetting behavior was
determined using contact angles measurements with the
sessile drop method.
Original language | English |
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Title of host publication | Technical Program & Abstracts |
Publisher | American Vacuum Society (AVS) |
Publication status | Published - 2014 |
Event | 14th International Conference on Atomic Layer Deposition, ALD 2014 - Kyoto, Japan Duration: 15 Jun 2014 → 18 Jun 2014 Conference number: 14 |
Conference
Conference | 14th International Conference on Atomic Layer Deposition, ALD 2014 |
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Abbreviated title | ALD 2014 |
Country/Territory | Japan |
City | Kyoto |
Period | 15/06/14 → 18/06/14 |
Keywords
- thin films
- ALD
- surface chemistry