An analytical approach to determine MOSFET RF extraction uncertainties due to S-parameter measurement errors

Jan Saijets, Markku Åberg

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    2 Citations (Scopus)

    Abstract

    The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The total differential error on input and output resistances and capacitances and also on the transconductance and feedback capacitance were calculated. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance can be extracted with less than 4% error at low frequencies below 2 - 3 GHz. Output capacitance is challenging because it can easily be 50% erroneous whereas the output resistance error is less than 20% for typical MOSFET output real part range of 3 Ω to 1 kΩ.
    Original languageEnglish
    Title of host publication62nd ARFTG Microwave Measurement Conference
    Subtitle of host publicationDifferential Measurements
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages99-108
    ISBN (Print)0-7803-8195-5
    DOIs
    Publication statusPublished - 2003
    MoE publication typeA4 Article in a conference publication
    Event62nd ARFTG Microwave Measurement Conference Fall 2003 - Boulder, United States
    Duration: 4 Dec 20035 Dec 2003

    Conference

    Conference62nd ARFTG Microwave Measurement Conference Fall 2003
    CountryUnited States
    CityBoulder
    Period4/12/035/12/03

    Keywords

    • uncertainty
    • MOSFET
    • RF
    • extraction

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