An analytical approach to determine MOSFET RF extraction uncertainties due to S-parameter measurement errors

Jan Saijets; Markku Åberg

doi:10.1109/ARFTGF.2003.1459760

An analytical approach to determine MOSFET RF extraction uncertainties due to S-parameter measurement errors

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

2 Citations (Scopus)

Abstract

The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The total differential error on input and output resistances and capacitances and also on the transconductance and feedback capacitance were calculated. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance can be extracted with less than 4% error at low frequencies below 2 - 3 GHz. Output capacitance is challenging because it can easily be 50% erroneous whereas the output resistance error is less than 20% for typical MOSFET output real part range of 3 Ω to 1 kΩ.

Original language	English
Title of host publication	62nd ARFTG Microwave Measurement Conference
Subtitle of host publication	Differential Measurements
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	99-108
ISBN (Print)	0-7803-8195-5
DOIs	https://doi.org/10.1109/ARFTGF.2003.1459760
Publication status	Published - 2003
MoE publication type	A4 Article in a conference publication
Event	62nd ARFTG Microwave Measurement Conference Fall 2003 - Boulder, United States Duration: 4 Dec 2003 → 5 Dec 2003

Conference

Conference	62nd ARFTG Microwave Measurement Conference Fall 2003
Country/Territory	United States
City	Boulder
Period	4/12/03 → 5/12/03

Keywords

uncertainty
MOSFET
RF
extraction

Access to Document

10.1109/ARFTGF.2003.1459760

Cite this

@inproceedings{af54049ec49e4978a79535cc64e962ff,

title = "An analytical approach to determine MOSFET RF extraction uncertainties due to S-parameter measurement errors",

abstract = "The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The total differential error on input and output resistances and capacitances and also on the transconductance and feedback capacitance were calculated. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance can be extracted with less than 4% error at low frequencies below 2 - 3 GHz. Output capacitance is challenging because it can easily be 50% erroneous whereas the output resistance error is less than 20% for typical MOSFET output real part range of 3 Ω to 1 kΩ.",

keywords = "uncertainty, MOSFET, RF, extraction",

author = "Jan Saijets and Markku {\AA}berg",

note = "Project code: T3SU00072; 62nd ARFTG Microwave Measurement Conference Fall 2003 ; Conference date: 04-12-2003 Through 05-12-2003",

year = "2003",

doi = "10.1109/ARFTGF.2003.1459760",

language = "English",

isbn = "0-7803-8195-5",

pages = "99--108",

booktitle = "62nd ARFTG Microwave Measurement Conference",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

}

Saijets, J & Åberg, M 2003, An analytical approach to determine MOSFET RF extraction uncertainties due to S-parameter measurement errors. in 62nd ARFTG Microwave Measurement Conference: Differential Measurements. IEEE Institute of Electrical and Electronic Engineers, pp. 99-108, 62nd ARFTG Microwave Measurement Conference Fall 2003, Boulder, Colorado, United States, 4/12/03. https://doi.org/10.1109/ARFTGF.2003.1459760

An analytical approach to determine MOSFET RF extraction uncertainties due to S-parameter measurement errors. / Saijets, Jan; Åberg, Markku.
62nd ARFTG Microwave Measurement Conference: Differential Measurements. IEEE Institute of Electrical and Electronic Engineers, 2003. p. 99-108.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - An analytical approach to determine MOSFET RF extraction uncertainties due to S-parameter measurement errors

AU - Saijets, Jan

AU - Åberg, Markku

N1 - Project code: T3SU00072

PY - 2003

Y1 - 2003

N2 - The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The total differential error on input and output resistances and capacitances and also on the transconductance and feedback capacitance were calculated. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance can be extracted with less than 4% error at low frequencies below 2 - 3 GHz. Output capacitance is challenging because it can easily be 50% erroneous whereas the output resistance error is less than 20% for typical MOSFET output real part range of 3 Ω to 1 kΩ.

AB - The effect of S parameter measurement errors resulting from vector network analyzer uncertainties on RF MOSFET parameter extraction are analyzed. The uncertainty effects on the MOSFET small signal equivalent circuit are studied. The total differential error on input and output resistances and capacitances and also on the transconductance and feedback capacitance were calculated. The results suggest that the input resistance extraction is very inaccurate. Transconductance and feedback capacitance can be extracted with less than 4% error at low frequencies below 2 - 3 GHz. Output capacitance is challenging because it can easily be 50% erroneous whereas the output resistance error is less than 20% for typical MOSFET output real part range of 3 Ω to 1 kΩ.

KW - uncertainty

KW - MOSFET

KW - RF

KW - extraction

U2 - 10.1109/ARFTGF.2003.1459760

DO - 10.1109/ARFTGF.2003.1459760

M3 - Conference article in proceedings

SN - 0-7803-8195-5

SP - 99

EP - 108

BT - 62nd ARFTG Microwave Measurement Conference

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 62nd ARFTG Microwave Measurement Conference Fall 2003

Y2 - 4 December 2003 through 5 December 2003

ER -

An analytical approach to determine MOSFET RF extraction uncertainties due to S-parameter measurement errors

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Conference

Keywords

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