An approach to modularization in model-based testing

Teemu Kanstren, Olli-Pekka Puolitaival, Juho Perälä

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

4 Citations (Scopus)

Abstract

Test models in model-based testing are typically represented as state machines in terms of states and transitions. These states and transitions also are typically the focus of the test modeling approaches. Yet these test models are basically software components for the test automation domain, and need to be considered from test automation and software engineering viewpoints. In this paper, we describe a modeling approach that takes better into account these viewpoints. Taking these viewpoints into account, we propose a modularization approach for modeling in model-based testing and present a tool for supporting this modularization approach.
Original languageEnglish
Title of host publicationProceedings of the 3rd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2011
PublisherInternational Academy, Research, and Industry Association IARIA
ISBN (Print)978-1-61208-168-7
Publication statusPublished - 2011
MoE publication typeA4 Article in a conference publication
Event3rd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2011 - Barcelona, Spain
Duration: 23 Oct 201129 Oct 2011

Conference

Conference3rd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2011
Abbreviated titleVALID 2011
CountrySpain
CityBarcelona
Period23/10/1129/10/11

Keywords

  • model based testing
  • test automation
  • modularization

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    Kanstren, T., Puolitaival, O-P., & Perälä, J. (2011). An approach to modularization in model-based testing. In Proceedings of the 3rd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2011 International Academy, Research, and Industry Association IARIA. https://www.thinkmind.org/index.php?view=article&articleid=valid_2011_1_20_40024