An experimental study of standard packaged/unpackaged GaAs MMIC based RF-MEMS limiter test circuits

R. Jonsson; C. Samuelsson; S. Reyaz; R. Malmqvist; D. Smith; M. Richard; Pekka Rantakari; Tauno Vähä-Heikkilä; R. Baggen

doi:10.1109/SMICND.2011.6095759

An experimental study of standard packaged/unpackaged GaAs MMIC based RF-MEMS limiter test circuits

R. Jonsson, C. Samuelsson, S. Reyaz, R. Malmqvist, D. Smith, M. Richard, Pekka Rantakari, Tauno Vähä-Heikkilä, R. Baggen

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

3 Citations (Scopus)

Abstract

We present an experimental study of some GaAs MMIC based RF-MEMS switch networks used here as limiter test circuits and that were tested also within a standard low-frequency package. The small and large signal results for such discrete as well as packaged GaAs MEMS limiter MMICs shows possibilities for obtaining a very wideband RF power limiter functionality within small circuit dimensions. Self switch actuation tests made on a packaged GaAs MEMS limiter circuit showed a power limiting effect of 11 dB for an RF input power of 16 dBm at 4 GHz

Original language	English
Title of host publication	CAS 2011 Proceedings
Subtitle of host publication	International Semiconductor Conference
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	203-206
ISBN (Electronic)	978-1-61284-172-4
ISBN (Print)	978-1-61284-173-1
DOIs	https://doi.org/10.1109/SMICND.2011.6095759
Publication status	Published - 2011
MoE publication type	B3 Non-refereed article in conference proceedings
Event	34th International Semiconductor Conference, CAS 2011 - Sinaia, Romania Duration: 17 Oct 2011 → 19 Oct 2011

Conference

Conference	34th International Semiconductor Conference, CAS 2011
Abbreviated title	CAS 2011
Country/Territory	Romania
City	Sinaia
Period	17/10/11 → 19/10/11

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10.1109/SMICND.2011.6095759

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Jonsson, R., Samuelsson, C., Reyaz, S., Malmqvist, R., Smith, D., Richard, M., Rantakari, P., Vähä-Heikkilä, T., & Baggen, R. (2011). An experimental study of standard packaged/unpackaged GaAs MMIC based RF-MEMS limiter test circuits. In CAS 2011 Proceedings : International Semiconductor Conference (pp. 203-206). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/SMICND.2011.6095759

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title = "An experimental study of standard packaged/unpackaged GaAs MMIC based RF-MEMS limiter test circuits",

abstract = "We present an experimental study of some GaAs MMIC based RF-MEMS switch networks used here as limiter test circuits and that were tested also within a standard low-frequency package. The small and large signal results for such discrete as well as packaged GaAs MEMS limiter MMICs shows possibilities for obtaining a very wideband RF power limiter functionality within small circuit dimensions. Self switch actuation tests made on a packaged GaAs MEMS limiter circuit showed a power limiting effect of 11 dB for an RF input power of 16 dBm at 4 GHz",

author = "R. Jonsson and C. Samuelsson and S. Reyaz and R. Malmqvist and D. Smith and M. Richard and Pekka Rantakari and Tauno V{\"a}h{\"a}-Heikkil{\"a} and R. Baggen",

year = "2011",

doi = "10.1109/SMICND.2011.6095759",

language = "English",

isbn = "978-1-61284-173-1",

pages = "203--206",

booktitle = "CAS 2011 Proceedings",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

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Jonsson, R, Samuelsson, C, Reyaz, S, Malmqvist, R, Smith, D, Richard, M, Rantakari, P , Vähä-Heikkilä, T & Baggen, R 2011, An experimental study of standard packaged/unpackaged GaAs MMIC based RF-MEMS limiter test circuits. in CAS 2011 Proceedings : International Semiconductor Conference. IEEE Institute of Electrical and Electronic Engineers, pp. 203-206, 34th International Semiconductor Conference, CAS 2011, Sinaia, Romania, 17/10/11. https://doi.org/10.1109/SMICND.2011.6095759

An experimental study of standard packaged/unpackaged GaAs MMIC based RF-MEMS limiter test circuits. / Jonsson, R.; Samuelsson, C.; Reyaz, S. et al.

CAS 2011 Proceedings : International Semiconductor Conference. IEEE Institute of Electrical and Electronic Engineers, 2011. p. 203-206.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

TY - GEN

T1 - An experimental study of standard packaged/unpackaged GaAs MMIC based RF-MEMS limiter test circuits

AU - Jonsson, R.

AU - Samuelsson, C.

AU - Reyaz, S.

AU - Malmqvist, R.

AU - Smith, D.

AU - Richard, M.

AU - Rantakari, Pekka

AU - Vähä-Heikkilä, Tauno

AU - Baggen, R.

PY - 2011

Y1 - 2011

N2 - We present an experimental study of some GaAs MMIC based RF-MEMS switch networks used here as limiter test circuits and that were tested also within a standard low-frequency package. The small and large signal results for such discrete as well as packaged GaAs MEMS limiter MMICs shows possibilities for obtaining a very wideband RF power limiter functionality within small circuit dimensions. Self switch actuation tests made on a packaged GaAs MEMS limiter circuit showed a power limiting effect of 11 dB for an RF input power of 16 dBm at 4 GHz

AB - We present an experimental study of some GaAs MMIC based RF-MEMS switch networks used here as limiter test circuits and that were tested also within a standard low-frequency package. The small and large signal results for such discrete as well as packaged GaAs MEMS limiter MMICs shows possibilities for obtaining a very wideband RF power limiter functionality within small circuit dimensions. Self switch actuation tests made on a packaged GaAs MEMS limiter circuit showed a power limiting effect of 11 dB for an RF input power of 16 dBm at 4 GHz

U2 - 10.1109/SMICND.2011.6095759

DO - 10.1109/SMICND.2011.6095759

M3 - Conference article in proceedings

SN - 978-1-61284-173-1

SP - 203

EP - 206

BT - CAS 2011 Proceedings

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - 34th International Semiconductor Conference, CAS 2011

Y2 - 17 October 2011 through 19 October 2011

ER -

An experimental study of standard packaged/unpackaged GaAs MMIC based RF-MEMS limiter test circuits

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