An international joint research to explore the method for Digital I&C reliability assessment: OECD/NEA DIGMAP

Sung Min Shin, Markus Porthin, Tero Tyrväinen, Christian Mueller, Ewgenij Piljugin, Jan Stiller, Richard Quatrain, Jeanne Demgne, Hans Brinkman, Venkat Natarajan, Paolo Picca, Joshua Gordon, Jiri Sedlak, Milan Jaros

    Research output: Contribution to conferenceConference articleScientific

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    Engineering & Materials Science