TY - JOUR
T1 - Analysis of different measurement setups for a programmable Josephson voltage standard
AU - Behr, Ralf
AU - Kohlmann, Johannes
AU - Janssen, Jan-Theodor B.M.
AU - Kleinschmidt, Peter
AU - Williams, Jonathan M.
AU - Djordjevic, Sophie
AU - Lo-Hive, Jean-Pierre
AU - Piquemal, François
AU - Hetland, Per-Otto
AU - Reymann, Dominique
AU - Eklund, Gunnar
AU - Hof, Christian
AU - Jeanneret, Blaise
AU - Chevtchenko, Oleg
AU - Houtzager, Ernest
AU - van den Brom, Helko E.
AU - Sosso, Andrea
AU - Andreone, Dominico
AU - Nissilä, Jaani
AU - Helistö, Panu
PY - 2003
Y1 - 2003
N2 - The electrical characteristics of two different 1-V binary programmable Josephson arrays, an superconductor/insulator/normal conductor/insulator/superconductor-type Josephson array, and an externally shunted superconductor/insulator/superconductor-type Josephson array, were investigated at ten metrology institutes. Various operational parameters were evaluated and compared using different Josephson array voltage standard setups at microwave frequencies around 70 GHz. The results of the measurements show that both arrays have been working very well and the main differences were not imposed by the arrays themselves, but by the different measurement setups of the laboratories.
AB - The electrical characteristics of two different 1-V binary programmable Josephson arrays, an superconductor/insulator/normal conductor/insulator/superconductor-type Josephson array, and an externally shunted superconductor/insulator/superconductor-type Josephson array, were investigated at ten metrology institutes. Various operational parameters were evaluated and compared using different Josephson array voltage standard setups at microwave frequencies around 70 GHz. The results of the measurements show that both arrays have been working very well and the main differences were not imposed by the arrays themselves, but by the different measurement setups of the laboratories.
U2 - 10.1109/TIM.2003.811570
DO - 10.1109/TIM.2003.811570
M3 - Article
SN - 0018-9456
VL - 52
SP - 524
EP - 528
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
IS - 2
ER -